Inventor · disambiguated record
Francois Weisbuch
Also filed as: WEISBUCH FRANCOIS · WEISBUCH FRANCOIS C
4 granted patents·2 pending applications·8 citations·filing 2010–2025
66Inventor score
Top patents by PatentIndex Score
6 records- 0173US9646220B2Methods and media for averaging contours of wafer feature edgesGLOBALFOUNDRIES INC·Filed 2013·Granted May 9, 2017·5 cites·18 claims
- 0265US10114282B2Sampling for OPC buildingGLOBALFOUNDRIES INC·Filed 2017·Granted Oct 30, 2018·1 cites·13 claims
- 0363US8332783B2Control of critical dimensions in optical imaging processes for semiconductor production by extracting imaging imperfections on the basis of imaging tool specific intensity measurements and simulationsSELTMANN ROLF·Filed 2010·Granted Dec 11, 2012·2 cites·20 claims
- 0448US2025311369A1Gate structure with jutted region over corner segment of semiconductor regionGLOBALFOUNDRIES US INC·Filed 2025·Application pending·0 cites
- 0544US9690187B2Sampling for OPC model buildingGLOBALFOUNDRIES INC·Filed 2015·Granted Jun 27, 2017·0 cites·8 claims
- 0634US2018284597A1Etch kernel definition for etch modelingGLOBALFOUNDRIES INC·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →