Inventor · disambiguated record
Fumihiro Sasajima
Also filed as: SASAJIMA FUMIHIRO
27 granted patents·7 pending applications·130 citations·filing 2000–2023
96Inventor score
Top patents by PatentIndex Score
34 records- 0194US10714304B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 14, 2020·8 cites·12 claims
- 0292US7705300B2Charged particle beam adjusting method and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 27, 2010·15 cites·11 claims
- 0389US8304724B2Microstructured pattern inspection methodSASAJIMA FUMIHIRO·Filed 2010·Granted Nov 6, 2012·5 cites·8 claims
- 0489US7435959B2Microstructured pattern inspection methodHITACHI LTD·Filed 2007·Granted Oct 14, 2008·7 cites·20 claims
- 0589US7217923B2Microstructured pattern inspection methodHITACHI LTD·Filed 2005·Granted May 15, 2007·7 cites·11 claims
- 0688US7791021B2Microstructured pattern inspection methodHITACHI LTD·Filed 2008·Granted Sep 7, 2010·6 cites·15 claims
- 0787US7545977B2Image processing apparatus for analysis of pattern matching failureHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 9, 2009·10 cites·8 claims
- 0886US10186399B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 22, 2019·4 cites·10 claims
- 0986US9892887B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 13, 2018·3 cites·7 claims
- 1083US10340115B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 2, 2019·2 cites·11 claims
- 1181US7180062B2Pattern measuring methodHITACHI HIGH TECH CORP·Filed 2005·Granted Feb 20, 2007·5 cites·5 claims
- 1278US12141173B2Error factor estimation device and error factor estimation methodHITACHI HIGH TECH CORP·Filed 2020·Granted Nov 12, 2024·1 cites·10 claims
- 1377US6765204B2Microstructured pattern inspection methodHITACHI LTD·Filed 2003·Granted Jul 20, 2004·7 cites·12 claims
- 1476US9153418B2Charged particle radiation apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 6, 2015·2 cites·6 claims
- 1576US7381951B2Charged particle beam adjustment method and apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Jun 3, 2008·4 cites·9 claims
- 1675US7884322B2Scanning electron microscope and a method for pattern composite inspection using the sameHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 8, 2011·10 cites·9 claims
- 1775US6573499B1Microstructured pattern inspection methodHITACHI LTD·Filed 2000·Granted Jun 3, 2003·12 cites·11 claims
- 1872US7288764B2Pattern measuring methodHITACHI HIGH TECH CORP·Filed 2007·Granted Oct 30, 2007·2 cites·10 claims
- 1969US8200006B2Image processing apparatus for analysis of pattern matching failureIKEDA MITSUJI·Filed 2009·Granted Jun 12, 2012·6 cites·12 claims
- 2062US8953855B2Edge detection technique and charged particle radiation equipmentNAMAI HITOSHI·Filed 2009·Granted Feb 10, 2015·6 cites·8 claims
- 2160US8953894B2Pattern matching method and image processing deviceSATO YOSHIMICHI·Filed 2009·Granted Feb 10, 2015·2 cites·12 claims
- 2259US6936819B2Microstructured pattern inspection methodHITACHI LTD·Filed 2004·Granted Aug 30, 2005·4 cites·31 claims
- 2358US2024111281A1Deterioration Prediction System and Deterioration Prediction Method for Semiconductor Manufacturing Equipment or Semiconductor Inspection EquipmentHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 2455US8478078B2Pattern-searching condition determining method, and pattern-searching condition setting deviceSAKAI KEI·Filed 2009·Granted Jul 2, 2013·0 cites·8 claims
- 2555US8305435B2Image processing system and scanning electron microscopeSATO YOSHIMICHI·Filed 2008·Granted Nov 6, 2012·2 cites·10 claims
- 2652US11899437B2Diagnostic systemHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 13, 2024·0 cites·16 claims
- 2752US2012305764A1Method of determining the concavity and convexity on sample surface, and charged particle beam apparatusKIMURA YOSHIHIRO·Filed 2012·Application pending·0 cites
- 2851US2024403183A1Error Factor Estimation Device, Error Factor Estimation Method, and Computer-Readable MediumHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2949US2010181478A1Charged particle beam adjusting method and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2010·Application pending·0 cites
- 3044US2004222375A1Method of determining the concavity and convexity on sample surface, and charged particle beam apparatusFiled 2004·Application pending·0 cites
- 3140US2009097735A1Sample inspection, measuring method and charged particle beam apparatusSASAJIMA FUMIHIRO·Filed 2008·Application pending·0 cites
- 3239US9104913B2Pattern measuring method, pattern measuring apparatus, and program using sameSASAJIMA FUMIHIRO·Filed 2011·Granted Aug 11, 2015·0 cites·10 claims
- 3338US9329034B2Pattern determination device and computer programNAMAI HITOSHI·Filed 2011·Granted May 3, 2016·0 cites·20 claims
- 3435US2012138796A1Signal Processing Method for Charged Particle Beam Device, and Signal Processing DeviceSASAJIMA FUMIHIRO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →