Inventor · disambiguated record
Gabriel G. Barna
Also filed as: BARNA GABRIEL G · BARNA GABRIEL GEORGE
15 granted patents·1 pending application·684 citations·filing 1987–2009
94Inventor score
Top patents by PatentIndex Score
16 records- 0197US4847792AProcess and apparatus for detecting aberrations in production process operationsTEXAS INSTRUMENTS INC·Filed 1987·Granted Jul 11, 1989·140 cites·41 claims
- 0293US5864773AVirtual sensor based monitoring and fault detection/classification system and method for semiconductor processing equipmentTEXAS INSTRUMENTS INC·Filed 1996·Granted Jan 26, 1999·259 cites·18 claims
- 0388US4859277AMethod for measuring plasma properties in semiconductor processingTEXAS INSTRUMENTS INC·Filed 1988·Granted Aug 22, 1989·43 cites·32 claims
- 0484US5512130AMethod and apparatus of etching a clean trench in a semiconductor materialTEXAS INSTRUMENTS INC·Filed 1994·Granted Apr 30, 1996·115 cites·16 claims
- 0583US8058161B2Recessed STI for wide transistorsBARNA GABRIEL GEORGE·Filed 2006·Granted Nov 15, 2011·16 cites·20 claims
- 0679US7344957B2SOI wafer with cooling channels and a method of manufacture thereofTEXAS INSTRUMENTS INC·Filed 2005·Granted Mar 18, 2008·9 cites·8 claims
- 0778US5326975AMeasurement of gas leaks into gas lines of a plasma reactorTEXAS INSTRUMENTS INC·Filed 1993·Granted Jul 5, 1994·47 cites·15 claims
- 0872US7642144B2Transistors with recessed active trenches for increased effective gate widthTEXAS INSTRUMENTS INC·Filed 2006·Granted Jan 5, 2010·5 cites·17 claims
- 0965US6104487APlasma etching with fast endpoint detectorTEXAS INSTRUMENTS INC·Filed 1997·Granted Aug 15, 2000·28 cites·13 claims
- 1058US7939398B2Method to manufacture silicon quantum islands and single-electron devicesTEXAS INSTRUMENTS INC·Filed 2009·Granted May 10, 2011·1 cites·7 claims
- 1155US7198993B2Method of fabricating a combined fully-depleted silicon-on-insulator (FD-SOI) and partially-depleted silicon-on-insulator (PD-SOI) devicesTEXAS INSTRUMENTS INC·Filed 2004·Granted Apr 3, 2007·7 cites·14 claims
- 1249US7122413B2Method to manufacture silicon quantum islands and single-electron devicesTEXAS INSTRUMENTS INC·Filed 2003·Granted Oct 17, 2006·3 cites·14 claims
- 1348US6875656B2Method for improving silicon-on-insulator (SOI) film uniformity on a semiconductor waferTEXAS INSTRUMENTS INC·Filed 2003·Granted Apr 5, 2005·3 cites·38 claims
- 1446US2007007596A1Method to manufacture silicon quantum islands and single-electron devicesTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
- 1537US6438439B1Equipment evaluation and designTEXAS INSTRUMENTS INC·Filed 1998·Granted Aug 20, 2002·6 cites·4 claims
- 1628US5254216AOxygen scavenging in a plasma reactorTEXAS INSTRUMENTS INC·Filed 1991·Granted Oct 19, 1993·2 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →