Inventor · disambiguated record
Garry C. Gillette
Also filed as: GILLETTE GARRY · GILLETTE GARRY C
11 granted patents·513 citations·filing 1981–1997
93Inventor score
Top patents by PatentIndex Score
11 records- 0195US6028439AModular integrated circuit tester with distributed synchronization and controlCREDENCE SYSTEMS CORP·Filed 1997·Granted Feb 22, 2000·161 cites·13 claims
- 0292US4659155ABackplane-daughter board connectorTERADYNE INC·Filed 1985·Granted Apr 21, 1987·81 cites·9 claims
- 0391US6011403ACircuit arrangement for measuring leakage current utilizing a differential integrating capacitorCREDENCE SYSTEMS CORP·Filed 1997·Granted Jan 4, 2000·95 cites·5 claims
- 0480US6073263AParallel processing pattern generation system for an integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted Jun 6, 2000·47 cites·20 claims
- 0576US4451918ATest signal reloaderTERADYNE INC·Filed 1981·Granted May 29, 1984·28 cites·8 claims
- 0667US6028438ACurrent sense circuitCREDENCE SYSTEMS CORP·Filed 1997·Granted Feb 22, 2000·29 cites·8 claims
- 0766US6005408ASystem for compensating for temperature induced delay variation in an integrated circuitCREDENCE SYSTEMS CORP·Filed 1997·Granted Dec 21, 1999·21 cites·12 claims
- 0861US5955890ABackmatch resistor structure for an integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted Sep 21, 1999·17 cites·16 claims
- 0955US5905403AMultiple output programmable reference voltage sourceCREDENCE SYSTEMS CORP·Filed 1997·Granted May 18, 1999·19 cites·12 claims
- 1044US5952821ALoad circuit for integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted Sep 14, 1999·11 cites·16 claims
- 1133US6008683ASwitchable load for testing a semiconductor integrated circuit deviceCREDENCE SYSTEMS CORP·Filed 1997·Granted Dec 28, 1999·4 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →