Inventor · disambiguated record
Galen Gledhill
Also filed as: Gledhill Galen
4 granted patents·5 pending applications·16 citations·filing 2018–2024
67Inventor score
Top patents by PatentIndex Score
9 records- 0184US10923318B2Optical alignment correction using convolutional neural network evaluation of a beam imageFEI CO·Filed 2018·Granted Feb 16, 2021·12 cites·28 claims
- 0277US10896802B2Combined SEM-CL and FIB-IOE microscopyMAAZOUZ MOSTAFA·Filed 2018·Granted Jan 19, 2021·4 cites·23 claims
- 0372US2024429018A1Methods and systems for elemental mappingFEI CO·Filed 2024·Application pending·0 cites
- 0460US2023095798A1Methods and systems for elemental mappingFEI CO·Filed 2021·Application pending·0 cites
- 0558US12505975B2Focused ion beam system and methodFEI CO·Filed 2023·Granted Dec 23, 2025·0 cites·16 claims
- 0657US2025112019A1Multipole elements and charged particle microscope systems including the sameFEI CO·Filed 2023·Application pending·0 cites
- 0757US2025112016A1Aberration correction systems and charged particle microscope systems including the sameFEI CO·Filed 2023·Application pending·0 cites
- 0856US2025372345A1Inhomogeneous d-shaped focused ion beamsFEI CO·Filed 2024·Application pending·0 cites
- 0943US10692694B2Method and apparatus for enhancing SE detection in mirror-based light imaging charged particle microscopesGledhill Galen·Filed 2018·Granted Jun 23, 2020·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →