Inventor · disambiguated record
Gadi Greenberg
Also filed as: GREENBERG GADI
13 granted patents·144 citations·filing 1999–2020
91Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD5APPLIED MATERIALS INC4GREENBERG GADI1SCHWARZBAND ISHAI1SHLAIN VLADIMIR1
Top patents by PatentIndex Score
13 records- 0190US9715723B2Optimization of unknown defect rejection for automatic defect classificationSHLAIN VLADIMIR·Filed 2012·Granted Jul 25, 2017·19 cites·21 claims
- 0286US6361910B1Straight line defect detectionAPPLIED MATERIALS INC·Filed 2000·Granted Mar 26, 2002·35 cites·20 claims
- 0385US7072502B2Alternating phase-shift mask inspection method and apparatusAPPLIED MATERIALS INC·Filed 2001·Granted Jul 4, 2006·32 cites·33 claims
- 0484US10043264B2Integration of automatic and manual defect classificationGREENBERG GADI·Filed 2012·Granted Aug 7, 2018·17 cites·18 claims
- 0579US7990546B2High throughput across-wafer-variation mappingAPPLIED MATERIALS ISRAEL LTD·Filed 2008·Granted Aug 2, 2011·6 cites·19 claims
- 0678US10901402B2Closed-loop automatic defect inspection and classificationAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jan 26, 2021·2 cites·11 claims
- 0772US7330249B2Qualification of a maskAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Feb 12, 2008·5 cites·24 claims
- 0870US10114368B2Closed-loop automatic defect inspection and classificationAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Oct 30, 2018·2 cites·20 claims
- 0970US6444382B1Straight line defect detection toolAPPLIED MATERIALS INC·Filed 2001·Granted Sep 3, 2002·9 cites·10 claims
- 1050US8098926B2Method and system for evaluating an evaluated pattern of a maskSCHWARZBAND ISHAI·Filed 2008·Granted Jan 17, 2012·2 cites·27 claims
- 1148US11263741B2System and methods of generating comparable regions of a lithographic maskAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Mar 1, 2022·0 cites·19 claims
- 1247US8160350B2Method and system for evaluating a variation in a parameter of a patternYISHAI MICHAEL BEN·Filed 2007·Granted Apr 17, 2012·2 cites·34 claims
- 1340US6603873B1Defect detection using gray level signaturesAPPLIED MATERIALS INC·Filed 1999·Granted Aug 5, 2003·13 cites·59 claims
Join the waitlist — get patent alerts
Get an alert when Gadi Greenberg files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →