Inventor · disambiguated record
Gangadhara Raja Muthinti
Also filed as: MUTHINTI GANGADHARA R · MUTHINTI GANGADHARA RAJA
19 granted patents·2 pending applications·14 citations·filing 2015–2022
89Inventor score
Top patents by PatentIndex Score
21 records- 0189US10943990B2Gate contact over active enabled by alternative spacer scheme and claw-shaped capIBM·Filed 2018·Granted Mar 9, 2021·5 cites·15 claims
- 0285US10903111B2Semiconductor device with linerless contactsIBM·Filed 2019·Granted Jan 26, 2021·4 cites·11 claims
- 0378US10586767B2Hybrid BEOL metallization utilizing selective reflection maskIBM·Filed 2018·Granted Mar 10, 2020·2 cites·20 claims
- 0474US10741609B2Pre-patterned etch stop for interconnect trench formation overlying embedded MRAM structuresIBM·Filed 2019·Granted Aug 11, 2020·1 cites·7 claims
- 0571US10923401B2Gate cut critical dimension shrink and active gate defect healing using selective depositionIBM·Filed 2018·Granted Feb 16, 2021·1 cites·20 claims
- 0671US10658233B2Dielectric damage-free dual damascene Cu interconnects without barrier at via bottomIBM·Filed 2018·Granted May 19, 2020·1 cites·7 claims
- 0770US11619877B2Determination of optical roughness in EUV structuresIBM·Filed 2022·Granted Apr 4, 2023·0 cites·20 claims
- 0865US11714045B2Techniques for characterizing films on optically clear substrates using ellipsometryMETA PLATFORMS TECH LLC·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 0965US11688632B2Semiconductor device with linerless contactsIBM·Filed 2020·Granted Jun 27, 2023·0 cites·18 claims
- 1065US10957646B2Hybrid BEOL metallization utilizing selective reflection maskIBM·Filed 2020·Granted Mar 23, 2021·0 cites·19 claims
- 1163US12086528B2Secure fingerprinting of a trusted photomaskIBM·Filed 2021·Granted Sep 10, 2024·0 cites·20 claims
- 1261US11309221B2Single metallization scheme for gate, source, and drain contact integrationIBM·Filed 2019·Granted Apr 19, 2022·0 cites·20 claims
- 1360US11101172B2Dielectric damage-free dual damascene Cu interconnects without barrier at via bottomIBM·Filed 2020·Granted Aug 24, 2021·0 cites·17 claims
- 1457US11480868B2Determination of optical roughness in EUV structuresIBM·Filed 2019·Granted Oct 25, 2022·0 cites·16 claims
- 1557US10985076B2Single metallization scheme for gate, source, and drain contact integrationIBM·Filed 2018·Granted Apr 20, 2021·0 cites·13 claims
- 1649US11054250B2Multi-channel overlay metrologyIBM·Filed 2018·Granted Jul 6, 2021·0 cites·9 claims
- 1748US11276636B2Adjustable via dimension and chamfer angleIBM·Filed 2019·Granted Mar 15, 2022·0 cites·17 claims
- 1848US2023177247A1Three-dimensional roughness extraction of metalIBM·Filed 2021·Application pending·0 cites
- 1946US11295969B2Hybridization for characterization and metrologyIBM·Filed 2018·Granted Apr 5, 2022·0 cites·17 claims
- 2045US10139358B2Method for characterization of a layered structureIBM·Filed 2016·Granted Nov 27, 2018·0 cites·20 claims
- 2132US2016343806A1Interface passivation layers and methods of fabricatingGLOBALFOUNDRIES INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →