Inventor · disambiguated record
Gary Woods
Also filed as: WOODS GARY · WOODS GARY L · WOODS GARY LEONARD
18 granted patents·5 pending applications·175 citations·filing 2000–2015
94Inventor score
Top patents by PatentIndex Score
23 records- 0193US7450245B2Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing systemDCG SYSTEMS INC·Filed 2006·Granted Nov 11, 2008·26 cites·32 claims
- 0286US6355494B1Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointingINTEL CORP·Filed 2000·Granted Mar 12, 2002·27 cites·20 claims
- 0381US9124755B2Apparatus and method for compressive imaging and sensing through multiplexed modulationKELLY KEVIN F·Filed 2010·Granted Sep 1, 2015·4 cites·7 claims
- 0481US8634009B2Dynamic range optimization in a compressive imaging systemKELLY KEVIN F·Filed 2011·Granted Jan 21, 2014·3 cites·23 claims
- 0580US7616312B2Apparatus and method for probing integrated circuits using laser illuminationDCG SYSTEMS INC·Filed 2005·Granted Nov 10, 2009·12 cites·55 claims
- 0680US7012537B2Apparatus and method for determining voltage using optical observationCREDENCE SYSTEMS CORP·Filed 2004·Granted Mar 14, 2006·23 cites·22 claims
- 0779US7679358B2System and method for voltage noise and jitter measurement using time-resolved emissionDCG SYSTEMS INC·Filed 2007·Granted Mar 16, 2010·9 cites·13 claims
- 0878US6501597B1Optical amplifier using wavelength converterSPECTRALANE INC·Filed 2001·Granted Dec 31, 2002·27 cites·28 claims
- 0968US6737880B2Device and method for probing instantaneous high-speed local supply voltage fluctuation in VLSI integrated circuits using IR emissionsINTEL CORP·Filed 2001·Granted May 18, 2004·13 cites·18 claims
- 1066US6596980B2Method and apparatus to measure statistical variation of electrical signal phase in integrated circuits using time-correlated photon countingINTEL CORP·Filed 2001·Granted Jul 22, 2003·13 cites·25 claims
- 1164US8717463B2Adaptively filtering compressive imaging measurements to attenuate noiseWOODS GARY L·Filed 2011·Granted May 6, 2014·2 cites·18 claims
- 1261US6579732B2Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointingINTEL CORP·Filed 2001·Granted Jun 17, 2003·5 cites·26 claims
- 1358US7232526B2Method and apparatus for controlling material removal from semiconductor substrate using induced current endpointingINTEL CORP·Filed 2004·Granted Jun 19, 2007·4 cites·26 claims
- 1457US7243039B1System and method for determining probing locations on ICCREDENCE SYSTEMS CORP·Filed 2006·Granted Jul 10, 2007·3 cites·19 claims
- 1544US9521306B2Apparatus and method for compressive imaging and sensing through multiplexed modulation via spinning disksKELLY KEVIN F·Filed 2015·Granted Dec 13, 2016·0 cites·20 claims
- 1644US6519744B2Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power planeINTEL CORP·Filed 2000·Granted Feb 11, 2003·4 cites·21 claims
- 1743US6780658B2Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointingINTEL CORP·Filed 2003·Granted Aug 24, 2004·0 cites·37 claims
- 1841US2011260036A1Temporally- And Spatially-Resolved Single Photon Counting Using Compressive Sensing For Debug Of Integrated Circuits, Lidar And Other ApplicationsBARANIUK RICHARD G·Filed 2011·Application pending·0 cites
- 1940US2013070138A1Number Of Pixels In Detector Arrays Using Compressive SensingBARANIUK RICHARD G·Filed 2011·Application pending·0 cites
- 2038US2015283429A1Multisensory real-time feedback training putterUNIV RICE WILLIAM M·Filed 2015·Application pending·0 cites
- 2136US2005002028A1Time resolved emission spectral analysis systemFiled 2003·Application pending·0 cites
- 2235US8451009B2Techniques employing light-emitting circuitsVILLAFANA MARTIN L·Filed 2010·Granted May 28, 2013·0 cites·23 claims
- 2333US2003118347A1Spectral inversion and chromatic dispersion management in optical transmission systemsSPECTRALANE·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →