Inventor · disambiguated record
Gerald Beyer
Also filed as: BEYER GERALD · BEYER GERALD PETER
10 granted patents·3 pending applications·119 citations·filing 1999–2020
88Inventor score
Top patents by PatentIndex Score
13 records- 0191US7319274B2Methods for selective integration of airgaps and devices made by such methodsIMEC INTER UNI MICRO ELECTR·Filed 2006·Granted Jan 15, 2008·30 cites·20 claims
- 0290US7452812B2Method to create super secondary grain growth in narrow trenchesIMEC INTER UNI MICRO ELECTR·Filed 2007·Granted Nov 18, 2008·17 cites·26 claims
- 0387US10886252B2Method of bonding semiconductor substratesIMEC VZW·Filed 2018·Granted Jan 5, 2021·8 cites·20 claims
- 0485US7078352B2Methods for selective integration of airgaps and devices made by such methodsTEXAS INSTRUMENTS INC·Filed 2004·Granted Jul 18, 2006·33 cites·21 claims
- 0579US7037851B2Methods for selective integration of airgaps and devices made by such methodsIMEC INTER UNI MICRO ELECTR·Filed 2004·Granted May 2, 2006·27 cites·23 claims
- 0662US7745935B2Method to create super secondary grain growth in narrow trenchesIMEC·Filed 2008·Granted Jun 29, 2010·1 cites·17 claims
- 0747US11810892B2Method of direct bonding semiconductor componentsIMEC VZW·Filed 2020·Granted Nov 7, 2023·0 cites·8 claims
- 0846US2010207177A1Method for producing a copper contactIMEC·Filed 2009·Application pending·0 cites
- 0944US7560357B2Method for creating narrow trenches in dielectric materialsIMEC INTER UNI MICRO ELECTR·Filed 2006·Granted Jul 14, 2009·0 cites·19 claims
- 1044US2006160353A1Methods for selective integration of airgaps and devices made by such methodsIMEC INTER UNI MICRO ELECTR·Filed 2006·Application pending·0 cites
- 1142US2006274405A1Ultraviolet curing process for low k dielectric filmsWALDFRIED CARLO·Filed 2006·Application pending·0 cites
- 1238US10141284B2Method of bonding semiconductor substratesIMEC VZW·Filed 2017·Granted Nov 27, 2018·0 cites·18 claims
- 1330US6245653B1Method of filling an opening in an insulating layerAPPLIED MATERIALS INC·Filed 1999·Granted Jun 12, 2001·3 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →