Inventor · disambiguated record
George W. Conner
Also filed as: CONNER GEORGE · CONNER GEORGE W
30 granted patents·3 pending applications·760 citations·filing 1981–2020
97Inventor score
Files withTERADYNE INC16CONNER GEORGE W11SIGNETICS CORP3NGUYEN THIEN D1NORTH AMERICAN PHILIPS CORP SI1
Top patents by PatentIndex Score
33 records- 0197US10959509B1Reuseable straw wash tool assemblyCONNER GEORGE W·Filed 2020·Granted Mar 30, 2021·5 cites·9 claims
- 0296US5794175ALow cost, highly parallel memory testerTERADYNE INC·Filed 1997·Granted Aug 11, 1998·166 cites·17 claims
- 0395US4450560ATester for LSI devices and memory devicesTERADYNE INC·Filed 1981·Granted May 22, 1984·86 cites·11 claims
- 0494US4569121AMethod of fabricating a programmable read-only memory cell incorporating an antifuse utilizing deposition of amorphous semiconductor layerSIGNETICS CORP·Filed 1983·Granted Feb 11, 1986·185 cites·19 claims
- 0592US10973352B1Reuseable straw caddyCONNER GEORGE W·Filed 2020·Granted Apr 13, 2021·3 cites·11 claims
- 0685US7046027B2Interface apparatus for semiconductor device testerTERADYNE INC·Filed 2004·Granted May 16, 2006·32 cites·24 claims
- 0785US6469493B1Low cost CMOS tester with edge rate compensationTERADYNE INC·Filed 1995·Granted Oct 22, 2002·65 cites·25 claims
- 0883US6879175B2Hybrid AC/DC-coupled channel for automatic test equipmentTERADYNE INC·Filed 2003·Granted Apr 12, 2005·22 cites·12 claims
- 0982US10827823B1Reusable straw wash tool assemblyCONNER GEORGE W·Filed 2019·Granted Nov 10, 2020·3 cites·8 claims
- 1082US8805636B2Protocol aware digital channel apparatusCONNER GEORGE W·Filed 2008·Granted Aug 12, 2014·10 cites·27 claims
- 1181US8269520B2Using pattern generators to control flow of data to and from a semiconductor device under testCONNER GEORGE W·Filed 2009·Granted Sep 18, 2012·10 cites·20 claims
- 1278US8195419B2General purpose protocol engineCONNER GEORGE W·Filed 2009·Granted Jun 5, 2012·6 cites·32 claims
- 1378US7593497B2Method and apparatus for adjustment of synchronous clock signalsTERADYNE INC·Filed 2005·Granted Sep 22, 2009·7 cites·12 claims
- 1474US5274796ATiming generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signalTERADYNE INC·Filed 1992·Granted Dec 28, 1993·36 cites·9 claims
- 1571US6486693B1Method and apparatus for testing integrated circuit chips that output clocks for timingTERADYNE INC·Filed 2000·Granted Nov 26, 2002·16 cites·18 claims
- 1667US7174279B2Test system with differential signal measurementTERADYNE INC·Filed 2004·Granted Feb 6, 2007·12 cites·24 claims
- 1767US4727409AProgrammable read-only memory formed with opposing PN diodesSIGNETICS CORP·Filed 1985·Granted Feb 23, 1988·35 cites·20 claims
- 1865US7523007B2Calibration deviceTERADYNE INC·Filed 2007·Granted Apr 21, 2009·2 cites·21 claims
- 1963US8094766B2Tracker circuit and method for automated test equipment systemsCONNER GEORGE W·Filed 2008·Granted Jan 10, 2012·4 cites·29 claims
- 2058US8725489B2Method for testing in a reconfigurable testerCONNER GEORGE W·Filed 2008·Granted May 13, 2014·2 cites·31 claims
- 2153US7673199B2Multi-stream interface for parallel test processingTERADYNE INC·Filed 2006·Granted Mar 2, 2010·1 cites·8 claims
- 2252US8521465B2General purpose protocol engineCONNER GEORGE W·Filed 2012·Granted Aug 27, 2013·0 cites·17 claims
- 2352US7208937B2Hybrid AC/DC-coupled channel for testingTERADYNE INC·Filed 2005·Granted Apr 24, 2007·1 cites·6 claims
- 2452US2009113245A1Protocol aware digital channel apparatusTERADYNE INC·Filed 2007·Application pending·0 cites
- 2551US2009112548A1A method for testing in a reconfigurable testerCONNER GEORGE W·Filed 2007·Application pending·0 cites
- 2650USD915153SStraw dispenserCONNER GEORGE W·Filed 2020·Granted Apr 6, 2021·1 cites·1 claims
- 2749USRE36063ETiming generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signalTERADYNE INC·Filed 1995·Granted Jan 26, 1999·15 cites·11 claims
- 2845US4933736AProgrammable read-only memoryNORTH AMERICAN PHILIPS CORP SI·Filed 1989·Granted Jun 12, 1990·14 cites·24 claims
- 2944US5268314AMethod of forming a self-aligned bipolar transistorPHILIPS ELECTRONICS NA·Filed 1992·Granted Dec 7, 1993·14 cites·9 claims
- 3040US9791511B2Method and apparatus for low latency communication in an automatic testing systemNGUYEN THIEN D·Filed 2013·Granted Oct 17, 2017·0 cites·30 claims
- 3138US9577818B2High speed data transfer using calibrated, single-clock source synchronous serializer-deserializer protocolTERADYNE INC·Filed 2015·Granted Feb 21, 2017·0 cites·11 claims
- 3234US4694566AMethod for manufacturing programmable read-only memory containing cells formed with opposing diodesSIGNETICS CORP·Filed 1985·Granted Sep 22, 1987·7 cites·14 claims
- 3329US2009063085A1Pmu testing via a pe stageTERADYNE INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →