A method for testing in a reconfigurable tester

Abstract

In some implementations, a method for testing is provided, which includes simulating a functional operational environment for a first type device-under-test with a tester. This includes recognizing a non-deterministic response signal having a predetermined protocol, receiving the non-deterministic response signal from the first type device-under-test, ascertaining an expected stimulus signal to be transferred to the first type device-under-test from the non-deterministic response signal based on the predetermined protocol, and initiating transmission of the expected stimulus signal to the first type device-under-test. The method further includes simulating a functional operational environment for a second type device-under-test with the tester after testing the first type device-under-test.

1 . A method for testing in a reconfigurable tester, the method comprising:
 simulating a functional operational environment for a first type device-under-test with a tester, comprising:
 recognizing a non-deterministic response signal comprising a predetermined protocol; 
 receiving the non-deterministic response signal from the first type device-under-test; 
 ascertaining an expected stimulus signal to be transferred to the first type device-under-test from the non-deterministic response signal based on the predetermined protocol; and 
 initiating transmission of the expected stimulus signal to the first type device-under-test; and 
   simulating a functional operational environment for a second type device-under-test with the tester after testing the first type device-under-test.   
     
     
         2 . The method for testing of  claim 1  further comprising storing the non-deterministic response signal within a response capture storage device. 
     
     
         3 . The method for testing of  claim 2 , wherein storing comprises storing the non-deterministic response signal within at least one of: 1) FIFO memory; or 2) random access memory. 
     
     
         4 . The method for testing of  claim 2  further comprising evaluating the non-deterministic response signal to determine if the non-deterministic response signal is correctly transmitted from the first type device-under-test to determine an operational condition of the first type device-under-test. 
     
     
         5 . The method for testing of  claim 4  further comprising:
 retaining at least one expected stimulus signal in an expected stimulus signal storage device; and   initiating selection of the at least one expected stimulus signal; and   describing a synchronizing timing and a latency delay at which the expected stimulus signal is to be transmitted to the first type device-under-test.   
     
     
         6 . The method for testing of  claim 5 , wherein retaining the at least one expected stimulus signal comprises retaining the at least one expected stimulus signal in at least one of: a) FIFO memory; or b) random access memory. 
     
     
         7 . The method for testing of  claim 5  further comprising:
 generating from an encoded stimulus data the expected stimulus signal for storage in the expected stimulus signal storage device.   
     
     
         8 . The method for testing of  claim 7  further comprising:
 managing transfer of the non-deterministic response signal from the response capture storage device based on the non-deterministic response signal when receiving a non-deterministic response signal; and   managing transfer of the deterministic response signal from the response capture storage device to determine that the first type device-under-test is operating correctly from the deterministic response signal when receiving a deterministic response signal.   
     
     
         9 . The method for testing of  claim 8  further comprising:
 managing the transfer of the expected stimulus signal to the expected stimulus signal storage device based on the non-deterministic response signal when receiving a non-deterministic response signal; and   transferring a deterministic stimulus signal when control of the transfer of the deterministic stimulus signal is independent of operational signals from the first type device-under-test.   
     
     
         10 . The method for testing of  claim 9 , wherein ascertaining an expected stimulus signal to be transferred to the first type device-under-test from the non-deterministic response signal based on a predetermined protocol comprises selecting the predetermined protocol from at least one of: a) a random access memory interface protocol; b) a communication interface protocol; or c) a computing device interface protocol. 
     
     
         11 . The method for testing of  claim 1 , wherein simulating the functional operational environment for the first type device-under-test comprises configuring the tester to recognize a non-deterministic response signal comprising a plurality of predetermined protocols. 
     
     
         12 . The method for testing of  claim 1  further comprising:
 receiving a response signal from the first type device-under-test;   ascertaining whether the response signal is a deterministic response signal; and   passing deterministic response signals for comparison with expected responses to determine whether the first type device-under-test is functioning correctly.   
     
     
         13 . The method for testing of  claim 1  wherein simulating a functional operational environment for a second type device-under-test comprises reprogramming the tester to recognize and respond to a non-deterministic response signal from the second type device-under-test comprising a predetermined protocol. 
     
     
         14 . A method for simulating a functional operational environment in a reconfigurable automated tester comprising:
 configuring the reconfigurable automated tester to be capable of ascertaining an expected stimulus signal for transfer to a first type SOC device-under-test from a non-deterministic response signal based on a predetermined protocol for the first type SOC device-under-test; and   reconfiguring the reconfigurable automated tester to be capable of ascertaining an expected stimulus signal for transfer to a second type SOC device-under-test from a non-deterministic response signal based on a predetermined protocol for the second type SOC device-under-test.   
     
     
         15 . The method for simulating a functional operational environment of  claim 14 , wherein configuring comprises programming a programmable circuit to respond to the predetermined protocol of the first type SOC device-under-test. 
     
     
         16 . The method for simulating a functional operational environment of  claim 15 , wherein configuring comprises programming a field programmable gate array to respond to the predetermined protocol of the first type SOC device-under-test. 
     
     
         17 . The method for simulating a functional operational environment of  claim 15 , wherein reconfiguring comprises reprogramming the programmable circuit to respond to the predetermined protocol of the second type SOC device-under-test. 
     
     
         18 . The method for simulating a functional operational environment of  claim 17 , wherein configuring comprises programming a field programmable gate array to respond to the predetermined protocol of the second type SOC device-under-test. 
     
     
         19 . The method for simulating a functional operational environment of  claim 14  further comprising reconfiguring the reconfigurable automated tester to be capable of ascertaining an expected stimulus signal to be transferred to a third type SOC device-under-test from a non-deterministic response signal based on a plurality of predetermined protocols for the third type SOC device-under-test. 
     
     
         20 . The method for simulating a functional operational environment of  claim 14  further comprising storing the non-deterministic response signal within a response capture storage device. 
     
     
         21 . The method for simulating a functional operational environment of  claim 20 , wherein storing comprises storing the non-deterministic response signal in at least one of: a) FIFO memory; or b) random access memory. 
     
     
         22 . The method for simulating a functional operational environment of  claim 14  further comprising storing the expected stimulus signal within an expected stimulus signal storage device. 
     
     
         23 . The method for simulating a functional operational environment of  claim 22 , wherein storing comprises storing the expected stimulus signal within at least one of: a) FIFO memory;
 or b) random access memory.   
     
     
         24 . The method for simulating a functional operational environment of  claim 14  further comprising:
 receiving a response signal from the first type SOC device-under-test;   ascertaining whether the response signal is a deterministic response signal; and   passing deterministic response signals for comparison with expected responses to determine whether the first type SOC device-under-test is functioning correctly.   
     
     
         25 . A method for testing in a reconfigurable tester, the method comprising:
 simulating a functional operational environment for a first type device-under-test with a tester, comprising configuring the tester to recognize and respond to a non-deterministic response signal from the first type device-under-test; and   simulating a functional operational environment for a second type device-under-test with the tester, comprising configuring the tester to recognize and respond to a non-deterministic response signal from the second type device-under-test after testing the first type device-under-test.