Inventor · disambiguated record
Germain Louis Fenger
Also filed as: FENGER GERMAIN L · FENGER GERMAIN LOUIS
7 granted patents·3 pending applications·24 citations·filing 2009–2023
78Inventor score
Top patents by PatentIndex Score
10 records- 0194US11061373B1Method and system for calculating probability of success or failure for a lithographic process due to stochastic variations of the lithographic processMENTOR GRAPHICS CORP·Filed 2019·Granted Jul 13, 2021·12 cites·17 claims
- 0292US11023644B1Optical proximity correction modeling with density-based gauge weightingMENTOR GRAPHICS CORP·Filed 2020·Granted Jun 1, 2021·4 cites·20 claims
- 0391US11194951B1Optical proximity correction model verificationMENTOR GRAPHICS CORP·Filed 2020·Granted Dec 7, 2021·5 cites·17 claims
- 0481US10496780B1Dynamic model generation for lithographic simulationMENTOR GRAPHICS CORP·Filed 2017·Granted Dec 3, 2019·3 cites·21 claims
- 0556US12511773B2Wafer image denoising and contour extraction for manufacturing process calibrationSIEMENS IND SOFTWARE INC·Filed 2022·Granted Dec 30, 2025·0 cites·20 claims
- 0656US12482090B2Wafer image defect detection and characterization for manufacturing process calibrationSIEMENS IND SOFTWARE INC·Filed 2022·Granted Nov 25, 2025·0 cites·14 claims
- 0756US2025111494A1Contour extraction of images with selection-based auto tuningSIEMENS IND SOFTWARE INC·Filed 2023·Application pending·0 cites
- 0852US11270054B1Method and system for calculating printed area metric indicative of stochastic variations of the lithographic processSIEMENS IND SOFTWARE INC·Filed 2020·Granted Mar 8, 2022·0 cites·21 claims
- 0946US2024346226A1Defectivity quantifer determinations for lithographical circuit fabrication processes through off-target process parametersSIEMENS IND SOFTWARE INC·Filed 2021·Application pending·0 cites
- 1032US2009294853A1Thin film transistor having a common channel and selectable doping configurationFENGER GERMAIN L·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →