Inventor · disambiguated record
George Imthurn
Also filed as: IMTHURN GEORGE · IMTHURN GEORGE P · IMTHURN GEORGE PETER
28 granted patents·2 pending applications·885 citations·filing 2004–2024
97Inventor score
Files withPSEMI CORP17PEREGRINE SEMICONDUCTOR CORP8BRINDLE CHRISTOPHER N2IMTHURN GEORGE1QUALCOMM INC1
Top patents by PatentIndex Score
30 records- 0198US10797690B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2019·Granted Oct 6, 2020·10 cites·30 claims
- 0298US10797691B1Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2020·Granted Oct 6, 2020·10 cites·13 claims
- 0398US10790814B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2019·Granted Sep 29, 2020·10 cites·29 claims
- 0498US10790815B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2019·Granted Sep 29, 2020·11 cites·29 claims
- 0598US10784855B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2019·Granted Sep 22, 2020·10 cites·29 claims
- 0698US10680600B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2019·Granted Jun 9, 2020·21 cites·30 claims
- 0798US10622990B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2018·Granted Apr 14, 2020·20 cites·25 claims
- 0898US10153763B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2017·Granted Dec 11, 2018·24 cites·18 claims
- 0998US9780775B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPEREGRINE SEMICONDUCTOR CORP·Filed 2015·Granted Oct 3, 2017·32 cites·18 claims
- 1098US9608619B2Method and apparatus improving gate oxide reliability by controlling accumulated chargePEREGRINE SEMICONDUCTOR CORP·Filed 2013·Granted Mar 28, 2017·35 cites·43 claims
- 1198US9130564B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPEREGRINE SEMICONDUCTOR CORP·Filed 2013·Granted Sep 8, 2015·35 cites·51 claims
- 1298US8405147B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkBRINDLE CHRISTOPHER N·Filed 2012·Granted Mar 26, 2013·58 cites·41 claims
- 1398US8129787B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkBRINDLE CHRISTOPHER N·Filed 2011·Granted Mar 6, 2012·101 cites·52 claims
- 1498US7910993B2Method and apparatus for use in improving linearity of MOSFET's using an accumulated charge sinkPEREGRINE SEMICONDUCTOR CORP·Filed 2006·Granted Mar 22, 2011·280 cites·39 claims
- 1598US7890891B2Method and apparatus improving gate oxide reliability by controlling accumulated chargePEREGRINE SEMICONDUCTOR CORP·Filed 2006·Granted Feb 15, 2011·141 cites·36 claims
- 1697US10797172B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reductionPSEMI CORP·Filed 2018·Granted Oct 6, 2020·10 cites·25 claims
- 1797US8954902B2Method and apparatus improving gate oxide reliability by controlling accumulated chargeSTUBER MICHAEL A·Filed 2011·Granted Feb 10, 2015·52 cites·104 claims
- 1896US10818796B2Method and apparatus improving gate oxide reliability by controlling accumulated chargePSEMI CORP·Filed 2017·Granted Oct 27, 2020·11 cites·30 claims
- 1995US11901459B2Method and apparatus improving gate oxide reliability by controlling accumulated chargePSEMI CORP·Filed 2021·Granted Feb 13, 2024·2 cites·20 claims
- 2090US2024388285A1Method and apparatus for use in improving linearity of mosfets using an accumulated charge sinkPSEMI CORP·Filed 2024·Application pending·0 cites
- 2188US11201245B2Method and apparatus improving gate oxide reliability by controlling accumulated chargePSEMI CORP·Filed 2020·Granted Dec 14, 2021·2 cites·27 claims
- 2282US11967948B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2022·Granted Apr 23, 2024·0 cites·20 claims
- 2380US7524710B2Radiation-hardened silicon-on-insulator CMOS device, and method of making the samePEREGRINE SEMICONDUCTOR CORP·Filed 2008·Granted Apr 28, 2009·8 cites·14 claims
- 2476US11362652B2Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sinkPSEMI CORP·Filed 2020·Granted Jun 14, 2022·0 cites·41 claims
- 2576US10707866B1Capacitance balance in dual sided contact switchQUALCOMM INC·Filed 2018·Granted Jul 7, 2020·2 cites·20 claims
- 2675USRE48944EMethod and apparatus for use in improving linearity of MOSFETS using an accumulated charge sinkPSEMI CORP·Filed 2020·Granted Feb 22, 2022·0 cites·18 claims
- 2766USRE48965EMethod and apparatus improving gate oxide reliability by controlling accumulated chargePSEMI CORP·Filed 2019·Granted Mar 8, 2022·0 cites·104 claims
- 2841US9390942B2Method, system, and apparatus for preparing substrates and bonding semiconductor layers to substratesPEREGRINE SEMICONDUCTOR CORP·Filed 2013·Granted Jul 12, 2016·0 cites·30 claims
- 2938US7411250B2Radiation-hardened silicon-on-insulator CMOS device, and method of making the samePEREGRINE SEMICONDUCTOR CORP·Filed 2004·Granted Aug 12, 2008·0 cites·18 claims
- 3038US2013154049A1Integrated Circuits on Ceramic Wafers Using Layer Transfer TechnologyIMTHURN GEORGE·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →