Inventor · disambiguated record
Georg Pelz
Also filed as: PELZ GEORG
9 granted patents·7 pending applications·25 citations·filing 2008–2018
82Inventor score
Top patents by PatentIndex Score
16 records- 0182US7940034B2Apparatus for detecting a state of operation of a power semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA·Filed 2008·Granted May 10, 2011·13 cites·28 claims
- 0275US10237940B2Thermal protection for light emitting devicesINFINEON TECHNOLOGIES AG·Filed 2016·Granted Mar 19, 2019·4 cites·21 claims
- 0373US8436600B2Apparatus for detecting a state of operation of a power semiconductor devicePELZ GEORG·Filed 2011·Granted May 7, 2013·5 cites·22 claims
- 0469US9859739B2Load driver circuit including load model parameter estimationINFINEON TECHNOLOGIES AG·Filed 2014·Granted Jan 2, 2018·3 cites·18 claims
- 0552US9411008B2Method and device for determining test sets of operating parameter values for an electronic componentINFINEON TECHNOLOGIES AG·Filed 2014·Granted Aug 9, 2016·0 cites·10 claims
- 0649US10746898B2Method and device for object recognition and analysisINFINEON TECHNOLOGIES AG·Filed 2018·Granted Aug 18, 2020·0 cites·21 claims
- 0746US9619595B2Generation of test stimuliINFINEON TECHNOLOGIES AG·Filed 2014·Granted Apr 11, 2017·0 cites·22 claims
- 0842US8868371B2Method and device for determining test sets of operating parameter values for an electronic componentPELZ GEORG·Filed 2011·Granted Oct 21, 2014·0 cites·25 claims
- 0940US9606568B2Dynamically adapting device operations to handle changes in power qualityINFINEON TECHNOLOGIES AG·Filed 2015·Granted Mar 28, 2017·0 cites·17 claims
- 1039US2015220667A1Application-based verification coverage using metamodelsINFINEON TECHNOLOGIES AG·Filed 2014·Application pending·0 cites
- 1136US2014172343A1Emulation System and MethodINFINEON TECHNOLOGIES AG·Filed 2012·Application pending·0 cites
- 1234US2020041618A1Matrix Light Source and Detector Device for Solid-State LidarINFINEON TECHNOLOGIES AG·Filed 2018·Application pending·0 cites
- 1331US2017242948A1Sensitivity analysis systems and methods using local gradientsINFINEON TECHNOLOGIES AG·Filed 2016·Application pending·0 cites
- 1431US2017242937A1Sensitivity analysis systems and methods using entropyINFINEON TECHNOLOGIES AG·Filed 2016·Application pending·0 cites
- 1530US2017061313A1System and Method for Estimating a Performance MetricINFINEON TECHNOLOGIES AG·Filed 2015·Application pending·0 cites
- 1629US2016329996A1Failure sensitivity analysisINFINEON TECHNOLOGIES AG·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →