Inventor · disambiguated record
Geert Van Der Plas
Also filed as: VAN DER PLAS GEERT
22 granted patents·7 pending applications·89 citations·filing 2007–2025
93Inventor score
Top patents by PatentIndex Score
29 records- 0196US11257764B2Integrated circuit with backside power delivery network and backside transistorIMEC VZW·Filed 2020·Granted Feb 22, 2022·7 cites·11 claims
- 0294US11121086B2Vertical isolated gate field effect transistor integrated in a semiconductor chipIMEC VZW·Filed 2019·Granted Sep 14, 2021·14 cites·15 claims
- 0390US8593170B2Method and device for testing TSVS in a 3D chip stackVAN DER PLAS GEERT·Filed 2010·Granted Nov 26, 2013·18 cites·18 claims
- 0488US10607901B2Stress sensor for semiconductor componentsIMEC VZW·Filed 2018·Granted Mar 31, 2020·6 cites·16 claims
- 0585US8199043B2Comparator based asynchronous binary search A/D converterVAN DER PLAS GEERT·Filed 2009·Granted Jun 12, 2012·17 cites·11 claims
- 0678US10998413B2Semiconductor fin structures having silicided portionsIMEC VZW·Filed 2019·Granted May 4, 2021·2 cites·19 claims
- 0777US8094051B2Sigma-delta-based analog-to-digital converterBOS LYNN·Filed 2010·Granted Jan 10, 2012·8 cites·13 claims
- 0876US7652600B2A/D converter comprising a voltage comparator deviceIMEC·Filed 2008·Granted Jan 26, 2010·10 cites·18 claims
- 0966US10811315B2Method for producing a through semiconductor via connectionIMEC VZW·Filed 2019·Granted Oct 20, 2020·1 cites·15 claims
- 1065US8625187B2Holographic visualization system comprising a high data refresh rate DND driver arrayVAN DER PLAS GEERT·Filed 2011·Granted Jan 7, 2014·1 cites·20 claims
- 1164US9201241B2Calibration of micro-mirror arraysIMEC·Filed 2013·Granted Dec 1, 2015·2 cites·9 claims
- 1260US2025308570A1Ferroelectric memory device and method of non-destructively reading sameIMEC VZW·Filed 2025·Application pending·0 cites
- 1357US2024213120A1Micro-electronic component combining power delivery and cooling from the back sideIMEC VZW·Filed 2023·Application pending·0 cites
- 1456US2023170297A1Semiconductor component including back side input/output signal routingIMEC VZW·Filed 2022·Application pending·0 cites
- 1554US11822475B2Integrated circuit with 3D partitioningIMEC VZW·Filed 2021·Granted Nov 21, 2023·0 cites·20 claims
- 1654US2023025767A1Semiconductor Structure with an Epitaxial Layer Stack for Fabricating Back-side ContactsIMEC VZW·Filed 2022·Application pending·0 cites
- 1753US9411000B2Method and system for measuring capacitance difference between capacitive elementsIMEC·Filed 2014·Granted Aug 9, 2016·1 cites·21 claims
- 1850US12154830B2Method of producing a gate cut in a semiconductor componentIMEC VZW·Filed 2022·Granted Nov 26, 2024·0 cites·10 claims
- 1950US11757039B2Method for inducing stress in semiconductor devicesIMEC VZW·Filed 2021·Granted Sep 12, 2023·0 cites·20 claims
- 2050US9217861B2Micro-mirror arraysIMEC VZW·Filed 2013·Granted Dec 22, 2015·0 cites·7 claims
- 2150US2022157704A1Electrode arrangement, a neural probe, and a method for manufacturing an electrode arrangementIMEC VZW·Filed 2021·Application pending·0 cites
- 2249US11621295B2Bipolar selector device for a memory arrayIMEC VZW·Filed 2020·Granted Apr 4, 2023·0 cites·20 claims
- 2346US7773010B2A/D converter comprising a voltage comparator deviceIMEC·Filed 2007·Granted Aug 10, 2010·2 cites·17 claims
- 2442US10825806B2Semiconductor integrated circuit manufactured using a plasma-processing stepIMEC VZW·Filed 2018·Granted Nov 3, 2020·0 cites·27 claims
- 2540US11114337B2Method for bonding and interconnecting semiconductor chipsIMEC VZW·Filed 2019·Granted Sep 7, 2021·0 cites·10 claims
- 2638US9847336B2Method of forming a junction field effect transistorIMEC VZW·Filed 2016·Granted Dec 19, 2017·0 cites·16 claims
- 2738US2012025841A1Capacitance measurement in microchipsKIM JAEMIN·Filed 2011·Application pending·0 cites
- 2834US10382042B2Assembly of integrated circuit modules and method for identifying the modulesIMEC VZW·Filed 2018·Granted Aug 13, 2019·0 cites·15 claims
- 2929US2012305542A1Oven Controlled MEMS Oscillator DeviceDONNAY STEPHANE·Filed 2011·Application pending·0 cites
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