Inventor · disambiguated record
Gerard Nicolaas Anne Van Veen
Also filed as: VAN VEEN GERARD · VAN VEEN GERARD NICOLAAS ANNE
15 granted patents·2 pending applications·177 citations·filing 2004–2023
91Inventor score
Top patents by PatentIndex Score
17 records- 0194US6963068B2Method for the manufacture and transmissive irradiation of a sample, and particle-optical systemFEI CO·Filed 2004·Granted Nov 8, 2005·72 cites·40 claims
- 0293US9620330B2Mathematical image assembly in a scanning-type microscopeFEI CO·Filed 2015·Granted Apr 11, 2017·15 cites·20 claims
- 0391US8450820B2Radiation detectorNANVER LIS KAREN·Filed 2011·Granted May 28, 2013·45 cites·19 claims
- 0489US7474419B2Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatusFEI CO·Filed 2006·Granted Jan 6, 2009·23 cites·20 claims
- 0586US10607811B1Multi-beam scanning transmission charged particle microscopeFEI CO·Filed 2019·Granted Mar 31, 2020·4 cites·12 claims
- 0684US10453647B2Emission noise correction of a charged particle sourceFEI CO·Filed 2017·Granted Oct 22, 2019·4 cites·22 claims
- 0784US9778377B2Method of performing spectroscopy in a transmission charged-particle microscopeFEI CO·Filed 2016·Granted Oct 3, 2017·5 cites·20 claims
- 0882US10832901B2EELS detection technique in an electron microscopeFEI CO·Filed 2019·Granted Nov 10, 2020·3 cites·15 claims
- 0981US9741529B2Micro-chamber for inspecting sample materialFEI CO·Filed 2016·Granted Aug 22, 2017·3 cites·20 claims
- 1074US10971326B2Multi-electron-beam imaging apparatus with improved performanceFEI CO·Filed 2019·Granted Apr 6, 2021·1 cites·12 claims
- 1174US9941094B1Innovative source assembly for ion beam productionFEI CO·Filed 2017·Granted Apr 10, 2018·2 cites·18 claims
- 1265US11551906B1Time-gated detection, dual-layer SPAD-based electron detectionFEI CO·Filed 2021·Granted Jan 10, 2023·0 cites·20 claims
- 1359US2024242929A1Detectors For MicroscopyFEI CO·Filed 2023·Application pending·0 cites
- 1458US12165835B2Stroboscopic illumination synchronized electron detection and imagingFEI CO·Filed 2021·Granted Dec 10, 2024·0 cites·21 claims
- 1553US10651005B2Innovative source assembly for ion beam productionFEI CO·Filed 2018·Granted May 12, 2020·0 cites·16 claims
- 1641US9812287B2Charged particle microscope with improved spectroscopic functionalityFEI CO·Filed 2015·Granted Nov 7, 2017·0 cites·19 claims
- 1737US2016056015A1Radiation Sensor, and its Application in a Charged-Particle MicroscopeFEI CO·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →