Inventor · disambiguated record
Gilad Barak
Also filed as: BARAK GILAD
53 granted patents·15 pending applications·433 citations·filing 2001–2025
98Inventor score
Top patents by PatentIndex Score
68 records- 0193US6583630B2Systems and methods for monitoring wear and/or displacement of artificial joint members, vertebrae, segments of fractured bones and dental implantsINTELLIJOINT SYSTEMS LTD·Filed 2001·Granted Jun 24, 2003·279 cites·51 claims
- 0292US12066385B2Raman spectroscopy based measurements in patterned structuresNOVA LTD·Filed 2022·Granted Aug 20, 2024·1 cites·16 claims
- 0392US11802829B2Method and system for broadband photoreflectance spectroscopyNOVA LTD·Filed 2020·Granted Oct 31, 2023·2 cites·10 claims
- 0492US11740183B2Accurate Raman spectroscopyNOVA LTD·Filed 2020·Granted Aug 29, 2023·2 cites·30 claims
- 0592US10359369B2Metrology test structure design and measurement scheme for measuring in patterned structuresNOVA MEASURING INSTR LTD·Filed 2015·Granted Jul 23, 2019·8 cites·24 claims
- 0692US10216098B2Test structure for use in metrology measurements of patternsNOVA MEASURING INSTR LTD·Filed 2015·Granted Feb 26, 2019·8 cites·18 claims
- 0792US2025389665A1Hybrid metrology method and systemNOVA LTD·Filed 2025·Application pending·0 cites
- 0890US12366533B2Hybrid metrology method and systemNOVA LTD·Filed 2024·Granted Jul 22, 2025·0 cites·23 claims
- 0990US2025123210A1Raman spectroscopy based measurements in patterned structuresNOVA LTD·Filed 2024·Application pending·0 cites
- 1089US10161885B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2015·Granted Dec 25, 2018·5 cites·19 claims
- 1189US2025130172A1Accurate raman spectroscopyNOVA LTD·Filed 2024·Application pending·0 cites
- 1288US12467879B2Optical phase measurement method and systemNOVA LTD·Filed 2024·Granted Nov 11, 2025·0 cites·16 claims
- 1388US11029258B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2018·Granted Jun 8, 2021·2 cites·20 claims
- 1487US12163892B2Accurate Raman spectroscopyNOVA LTD·Filed 2023·Granted Dec 10, 2024·0 cites·18 claims
- 1587US8848185B2Optical system and method for measuring in three-dimensional structuresBARAK GILAD·Filed 2012·Granted Sep 30, 2014·9 cites·15 claims
- 1686US12298182B2Optical technique for material characterizationNOVA LTD·Filed 2024·Granted May 13, 2025·0 cites·20 claims
- 1786US10876959B2Method and system for optical characterization of patterned samplesNOVA MEASURING INSTR LTD·Filed 2018·Granted Dec 29, 2020·2 cites·3 claims
- 1885US12372473B2Accurate Raman spectroscopyNOVA LTD·Filed 2024·Granted Jul 29, 2025·0 cites·18 claims
- 1985US10732116B2Hybrid metrology method and systemNOVA MEASURING INSTR LTD·Filed 2016·Granted Aug 4, 2020·2 cites·20 claims
- 2085US10564106B2Raman spectroscopy based measurements in patterned structuresNOVA MEASURING INSTR LTD·Filed 2016·Granted Feb 18, 2020·2 cites·13 claims
- 2184US11885737B2Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2020·Granted Jan 30, 2024·1 cites·8 claims
- 2284US11143601B2Test structure design for metrology measurements in patterned samplesNOVA LTD·Filed 2019·Granted Oct 12, 2021·2 cites·8 claims
- 2384US2024337590A1Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2024·Application pending·0 cites
- 2483US11946875B2Optical phase measurement system and methodNOVA LTD·Filed 2022·Granted Apr 2, 2024·0 cites·20 claims
- 2582US11860104B2Accurate raman spectroscopyNOVA LTD·Filed 2022·Granted Jan 2, 2024·0 cites·19 claims
- 2681US12360462B2Optical metrology system and methodNOVA LTD·Filed 2024·Granted Jul 15, 2025·0 cites·6 claims
- 2781US11927481B2Optical technique for material characterizationNOVA LTD·Filed 2022·Granted Mar 12, 2024·0 cites·22 claims
- 2881US10365231B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2018·Granted Jul 30, 2019·1 cites·17 claims
- 2981US6573706B2Method and apparatus for distance based detection of wear and the like in jointsINTELLIJOINT SYSTEMS LTD·Filed 2001·Granted Jun 3, 2003·89 cites·26 claims
- 3080US12196691B2X-ray based measurements in patterned structureNOVA LTD·Filed 2023·Granted Jan 14, 2025·0 cites·21 claims
- 3180US10209206B2Method and system for determining strain distribution in a sampleNOVA MEASURING INSTR LTD·Filed 2014·Granted Feb 19, 2019·6 cites·14 claims
- 3279US12025560B2Hybrid metrology method and systemNOVA LTD·Filed 2021·Granted Jul 2, 2024·0 cites·24 claims
- 3378US12152993B2Accurate Raman spectroscopyNOVA LTD·Filed 2021·Granted Nov 26, 2024·0 cites·20 claims
- 3476US11099142B2X-ray based measurements in patterned structureNOVA MEASURING INSTR LTD·Filed 2018·Granted Aug 24, 2021·1 cites·20 claims
- 3575US11150190B2Hybrid metrology method and systemNOVA LTD·Filed 2020·Granted Oct 19, 2021·0 cites·24 claims
- 3675US10073045B2Optical method and system for measuring isolated features of a structureNOVA MEASURING INSTR LTD·Filed 2013·Granted Sep 11, 2018·2 cites·29 claims
- 3775US9897553B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2014·Granted Feb 20, 2018·1 cites·20 claims
- 3874US11639901B2Test structure design for metrology measurements in patterned samplesNOVA LTD·Filed 2021·Granted May 2, 2023·0 cites·11 claims
- 3974US11415519B2Accurate Raman spectroscopyNOVA LTD·Filed 2020·Granted Aug 16, 2022·0 cites·20 claims
- 4074US2021364451A1Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2021·Application pending·0 cites
- 4173US11692953B2X-ray based measurements in patterned structureNOVA LTD·Filed 2021·Granted Jul 4, 2023·0 cites·20 claims
- 4273US11275027B2Raman spectroscopy based measurements in patterned structuresNOVA LTD·Filed 2020·Granted Mar 15, 2022·0 cites·20 claims
- 4373US9140544B2Optical system and method for measuring in patterned structuresBARAK GILAD·Filed 2012·Granted Sep 22, 2015·3 cites·27 claims
- 4469US11868054B2Optical metrology system and methodNOVA LTD·Filed 2021·Granted Jan 9, 2024·0 cites·15 claims
- 4569US11460415B2Optical phase measurement system and methodNOVA LTD·Filed 2020·Granted Oct 4, 2022·0 cites·18 claims
- 4668US10274435B2Method and system for optical metrology in patterned structuresNOVA MEASURING INSTR LTD·Filed 2015·Granted Apr 30, 2019·1 cites·15 claims
- 4768US10054423B2Optical method and system for critical dimensions and thickness characterizationNOVA MEASURING INSTR LTD·Filed 2013·Granted Aug 21, 2018·2 cites·15 claims
- 4866US11543294B2Optical technique for material characterizationNOVA LTD·Filed 2019·Granted Jan 3, 2023·0 cites·14 claims
- 4966US2025116605A1Accurate raman spectroscopyNOVA LTD·Filed 2024·Application pending·0 cites
- 5065US10663408B2Optical phase measurement system and methodNOVA MEASURING INSTR LTD·Filed 2019·Granted May 26, 2020·0 cites·20 claims
Showing the top 50 of 68 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →