Inventor · disambiguated record
Gong-Heum Han
Also filed as: HAN GONG-HEUM
13 granted patents·4 pending applications·126 citations·filing 1998–2015
92Inventor score
Top patents by PatentIndex Score
17 records- 0193US7315466B2Semiconductor memory device and method for arranging and manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jan 1, 2008·27 cites·14 claims
- 0291US9588840B2Memory devices that perform masked write operations and methods of operating the sameCHUNG HOI-JU·Filed 2014·Granted Mar 7, 2017·19 cites·30 claims
- 0390US7982221B2Semiconductor memory device having three dimensional structureSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Jul 19, 2011·15 cites·11 claims
- 0484US9164834B2Semiconductor memory devices, memory systems including the same and method of writing data in the sameCHUNG HOI-JU·Filed 2014·Granted Oct 20, 2015·8 cites·34 claims
- 0582US7589992B2Semiconductor device having three dimensional structureSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Sep 15, 2009·7 cites·43 claims
- 0681US9601172B2Address aligner and memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Mar 21, 2017·6 cites·18 claims
- 0771US10318469B2Semiconductor memory device, memory system, and method using bus-invert encodingSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 11, 2019·2 cites·17 claims
- 0862US7221611B2Semiconductor memory device for low power consumptionSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted May 22, 2007·5 cites·16 claims
- 0953US6067269ASemiconductor memory device capable of operating at a low power supply voltageSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted May 23, 2000·18 cites·6 claims
- 1052US6714463B2Semiconductor memory device having reduced chip select output timeSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 30, 2004·10 cites·20 claims
- 1151US7596044B2Semiconductor memory device having sense amplifier operable as a semi-latch type and a full-latch type based on timing and data sensing method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Sep 29, 2009·2 cites·9 claims
- 1251US6781899B2Semiconductor memory device and test method therofSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Aug 24, 2004·7 cites·41 claims
- 1348US7608880B2Semiconductor memory device having a peripheral region including operating capacitorsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Oct 27, 2009·0 cites·7 claims
- 1448US2011266623A1Semiconductor Memory Device Having Three Dimensional StructureHAN GONG-HEUM·Filed 2011·Application pending·0 cites
- 1547US2014317471A1Semiconductor memory devices including separately disposed error-correcting code (ecc) circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 1638US2014331006A1Semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 1735US2007183234A1Semiconductor memory device having reduced voltage coupling between bit linesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →