Inventor · disambiguated record
Gregory J. Uhlmann
Also filed as: UHLMANN GREGORY · UHLMANN GREGORY J · UHLMANN GREGORY JOHN
94 granted patents·11 pending applications·1,009 citations·filing 1996–2019
99Inventor score
Top patents by PatentIndex Score
105 records- 0195US7224633B1eFuse sense circuitIBM·Filed 2005·Granted May 29, 2007·49 cites·17 claims
- 0294US10043568B1Optimizing data approximation analysis using low power circuitryIBM·Filed 2017·Granted Aug 7, 2018·11 cites·7 claims
- 0394US8525245B2eDRAM having dynamic retention and performance tradeoffERICKSON KARL R·Filed 2011·Granted Sep 3, 2013·22 cites·9 claims
- 0494US6748556B1Changing the thread capacity of a multithreaded computer processorIBM·Filed 2000·Granted Jun 8, 2004·118 cites·16 claims
- 0593US10037792B1Optimizing data approximation analysis using low power circuitryIBM·Filed 2017·Granted Jul 31, 2018·11 cites·13 claims
- 0693US8816470B2Independently voltage controlled volume of silicon on a silicon on insulator chipERICKSON KARL R·Filed 2011·Granted Aug 26, 2014·16 cites·6 claims
- 0793US6681345B1Field protection against thread loss in a multithreaded computer processorIBM·Filed 2000·Granted Jan 20, 2004·103 cites·10 claims
- 0892US10598710B2Cognitive analysis using applied analog circuitsIBM·Filed 2017·Granted Mar 24, 2020·4 cites·13 claims
- 0992US9916890B1Predicting data correlation using multivalued logical outputs in static random access memory (SRAM) storage cellsIBM·Filed 2017·Granted Mar 13, 2018·10 cites·20 claims
- 1091US5778243AMulti-threaded cell for a memoryIBM·Filed 1996·Granted Jul 7, 1998·211 cites·35 claims
- 1190US9024387B2FinFET with body contactERICKSON KARL R·Filed 2012·Granted May 5, 2015·12 cites·7 claims
- 1289US6498057B1Method for implementing SOI transistor source connections using buried dual rail distributionIBM·Filed 2002·Granted Dec 24, 2002·47 cites·8 claims
- 1387US10418094B2Predicting data correlation using multivalued logical outputs in static random access memory (SRAM) storage cellsIBM·Filed 2018·Granted Sep 17, 2019·6 cites·20 claims
- 1485US9864006B1Generating a unique die identifier for an electronic chipIBM·Filed 2016·Granted Jan 9, 2018·4 cites·20 claims
- 1585US9245884B1Structure for metal oxide semiconductor capacitorIBM·Filed 2014·Granted Jan 26, 2016·5 cites·11 claims
- 1685US8435851B2Implementing semiconductor SoC with metal via gate node high performance stacked transistorsERICKSON KARL R·Filed 2011·Granted May 7, 2013·7 cites·6 claims
- 1785US6670716B2Silicon-on-insulator (SOI) semiconductor structure for implementing transistor source connections using buried dual rail distributionIBM·Filed 2002·Granted Dec 30, 2003·34 cites·8 claims
- 1884US10236050B2Optimizing data approximation analysis using low power circuitryIBM·Filed 2018·Granted Mar 19, 2019·4 cites·13 claims
- 1984US10224089B2Optimizing data approximation analysis using low bower circuitryIBM·Filed 2018·Granted Mar 5, 2019·4 cites·7 claims
- 2083US10304522B2Method for low power operation and test using DRAM deviceIBM·Filed 2017·Granted May 28, 2019·6 cites·15 claims
- 2182US9514841B1Implementing eFuse visual security of stored data using EDRAMIBM·Filed 2015·Granted Dec 6, 2016·4 cites·15 claims
- 2282US9018713B2Plural differential pair employing FinFET structureERICKSON KARL R·Filed 2012·Granted Apr 28, 2015·6 cites·6 claims
- 2382US7528646B2Electrically programmable fuse sense circuitIBM·Filed 2006·Granted May 5, 2009·14 cites·1 claims
- 2482US6895215B2Method and apparatus for transferring correspondence informationIBM·Filed 2000·Granted May 17, 2005·35 cites·20 claims
- 2581US8921199B1Precision IC resistor fabricationIBM·Filed 2013·Granted Dec 30, 2014·5 cites·18 claims
- 2681US7514276B1Aligning stacked chips using resistance assistanceIBM·Filed 2008·Granted Apr 7, 2009·12 cites·1 claims
- 2780US10191108B2On-chip sensor for monitoring active circuits on integrated circuit (IC) chipsGLOBALFOUNDRIES INC·Filed 2015·Granted Jan 29, 2019·2 cites·20 claims
- 2880US9583403B2Implementing resistance defect performance mitigation using test signature directed self heating and increased voltageIBM·Filed 2015·Granted Feb 28, 2017·2 cites·9 claims
- 2979US6629236B1Master-slave latch circuit for multithreaded processingIBM·Filed 1999·Granted Sep 30, 2003·74 cites·17 claims
- 3079US6211713B1Adjustable feedback for CMOS latchesIBM·Filed 1999·Granted Apr 3, 2001·33 cites·8 claims
- 3178US9053889B2Electronic fuse cell and arrayIBM·Filed 2013·Granted Jun 9, 2015·5 cites·15 claims
- 3277US10348320B1Charge-scaling adder circuitIBM·Filed 2018·Granted Jul 9, 2019·3 cites·20 claims
- 3376US9059307B1Method of implementing buried FET below and beside FinFET on bulk substrateIBM·Filed 2014·Granted Jun 16, 2015·2 cites·7 claims
- 3475US7725844B2Method and circuit for implementing eFuse sense amplifier verificationIBM·Filed 2008·Granted May 25, 2010·10 cites·12 claims
- 3574US9252083B2Semiconductor chip with power gating through silicon viasIBM·Filed 2015·Granted Feb 2, 2016·2 cites·7 claims
- 3673US8754499B1Semiconductor chip with power gating through silicon viasIBM·Filed 2013·Granted Jun 17, 2014·3 cites·20 claims
- 3773US7088994B2Network address lookup for telephony devicesIBM·Filed 2001·Granted Aug 8, 2006·14 cites·24 claims
- 3872US9646712B1Implementing eFuse visual security of stored data using EDRAMIBM·Filed 2016·Granted May 9, 2017·2 cites·5 claims
- 3972US8890083B2Soft error detectionPAONE PHIL C·Filed 2012·Granted Nov 18, 2014·4 cites·18 claims
- 4071US8953365B2Capacitor backup for SRAMIBM·Filed 2013·Granted Feb 10, 2015·3 cites·13 claims
- 4171US7489572B2Method for implementing eFuse sense amplifier testing without blowing the eFuseIBM·Filed 2007·Granted Feb 10, 2009·6 cites·11 claims
- 4270US9099164B2Capacitor backup for SRAMIBM·Filed 2013·Granted Aug 4, 2015·3 cites·5 claims
- 4370US9040406B2Semiconductor chip with power gating through silicon viasIBM·Filed 2013·Granted May 26, 2015·2 cites·13 claims
- 4470US6060909ACompound domino logic circuit including an output driver section with a latchIBM·Filed 1998·Granted May 9, 2000·24 cites·13 claims
- 4569US8735975B2Implementing semiconductor soc with metal via gate node high performance stacked transistorsIBM·Filed 2013·Granted May 27, 2014·2 cites·8 claims
- 4668US7532057B2Electrically programmable fuse sense circuitIBM·Filed 2007·Granted May 12, 2009·4 cites·4 claims
- 4767US8456187B2Implementing temporary disable function of protected circuitry by modulating threshold voltage of timing sensitive circuitERICKSON KARL R·Filed 2011·Granted Jun 4, 2013·2 cites·23 claims
- 4864US9378836B1Sensing circuit for a non-volatile memory cell having two complementary memory transistorsIBM·Filed 2014·Granted Jun 28, 2016·2 cites·12 claims
- 4964US7764531B2Implementing precise resistance measurement for 2D array efuse bit cell using differential sense amplifier, balanced bitlines, and programmable reference resistorIBM·Filed 2008·Granted Jul 27, 2010·5 cites·20 claims
- 5064US6163173AMethod and apparatus for implementing adjustable logic threshold in dynamic circuits for maximizing circuit performanceIBM·Filed 1999·Granted Dec 19, 2000·19 cites·16 claims
Showing the top 50 of 105 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →