Inventor · disambiguated record
Gunther Scheunert
Also filed as: SCHEUNERT GUNTHER
4 granted patents·1 pending application·6 citations·filing 2021–2025
64Inventor score
Technology areasH01J
Top patents by PatentIndex Score
5 records- 0194US11735393B2Method for operating a multi-beam particle beam microscopeCARL ZEISS MULTISEM GMBH·Filed 2021·Granted Aug 22, 2023·5 cites·24 claims
- 0291US12094683B2Method for operating a multi-beam particle beam microscopeCARL ZEISS MULTISEM GMBH·Filed 2023·Granted Sep 17, 2024·1 cites·20 claims
- 0384US12488958B2Method for operating a multi-beam particle beam microscopeCARL ZEISS MULTISEM GMBH·Filed 2024·Granted Dec 2, 2025·0 cites·20 claims
- 0452US2025183000A1Method of characterizing a fault in a scanning electron microscopeZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0550US12283457B2Multiple particle beam microscope and associated method with an improved focus setting taking into account an image plane tiltCARL ZEISS MULTISEM GMBH·Filed 2022·Granted Apr 22, 2025·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →