Inventor · disambiguated record
Guanyuan M. Yu
Also filed as: YU GUANYUAN M · YU GUANYUAN MICHAEL
2 granted patents·1 pending application·20 citations·filing 1999–2007
59Inventor score
Top patents by PatentIndex Score
3 records- 0179US7494893B1Identifying yield-relevant process parameters in integrated circuit device fabrication processesPDF SOLUTIONS INC·Filed 2007·Granted Feb 24, 2009·14 cites·20 claims
- 0237US2008312875A1Monitoring and control of integrated circuit device fabrication processesYU GUANYUAN M·Filed 2007·Application pending·0 cites
- 0334US6599132B1Scanning capacitance sample preparation techniqueUNIV LELAND STANFORD JUNIOR·Filed 1999·Granted Jul 29, 2003·6 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →