Inventor · disambiguated record
Hamid K. Aghajan
Also filed as: AGHAJAN HAMID · AGHAJAN HAMID K
10 granted patents·345 citations·filing 1992–2022
91Inventor score
Files withUNIV LELAND STANFORD JUNIOR4APPLIED MATERIALS INC2ADAPTRUM INC1AGHAJAN HAMID1NAT SEMICONDUCTOR CORP1
Top patents by PatentIndex Score
10 records- 0192US5513275AAutomated direct patterned wafer inspectionUNIV LELAND STANFORD JUNIOR·Filed 1994·Granted Apr 30, 1996·101 cites·4 claims
- 0287US10108757B1System and method for spectrum usage databases for cognitive radioAGHAJAN HAMID·Filed 2012·Granted Oct 23, 2018·11 cites·15 claims
- 0385US7228113B1SIMO/MISO transceiver for providing packet data communication with SISO transceiverNAT SEMICONDUCTOR CORP·Filed 2004·Granted Jun 5, 2007·35 cites·18 claims
- 0479US5311600AMethod of edge detection in optical images using neural network classifierUNIV LELAND STANFORD JUNIOR·Filed 1992·Granted May 10, 1994·89 cites·1 claims
- 0576US6614924B1Adaptive mask technique for defect inspectionAPPLIED MATERIALS INC·Filed 1999·Granted Sep 2, 2003·49 cites·10 claims
- 0666US12032882B1Spectrum usage databases for cognitive radioSILICONWAVES TECH CO LTD·Filed 2022·Granted Jul 9, 2024·0 cites·20 claims
- 0759US5583956AEstimation of skew angle in text imageUNIV LELAND STANFORD JUNIOR·Filed 1994·Granted Dec 10, 1996·34 cites·5 claims
- 0857US11361126B1Spectrum usage databases for cognitive radioADAPTRUM INC·Filed 2018·Granted Jun 14, 2022·0 cites·20 claims
- 0947US5418892ASubspace-based line detectionUNIV LELAND STANFORD JUNIOR·Filed 1993·Granted May 23, 1995·15 cites·5 claims
- 1041US6912304B1Two-dimensional scatter plot technique for defect inspectionAPPLIED MATERIALS INC·Filed 1999·Granted Jun 28, 2005·11 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →