Inventor · disambiguated record
Hans-Juergen Engelmann
Also filed as: ENGELMANN HANS-JUERGEN
3 granted patents·1 pending application·55 citations·filing 2001–2009
71Inventor score
Top patents by PatentIndex Score
4 records- 0183US6303399B1Method of sample preparation for electron microscopyADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 16, 2001·42 cites·23 claims
- 0254US7183629B2Metal line having an increased resistance to electromigration along an interface of a dielectric barrier layer by implanting material into the metal lineADVANCED MICRO DEVICES INC·Filed 2004·Granted Feb 27, 2007·8 cites·12 claims
- 0349US8039395B2Technique for forming embedded metal lines having increased resistance against stress-induced material transportGLOBALFOUNDRIES INC·Filed 2004·Granted Oct 18, 2011·5 cites·27 claims
- 0445US2010025742A1Transistor having a strained channel region caused by hydrogen-induced lattice deformationBEYER SVEN·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →