Inventor · disambiguated record
Haim Feldman
Also filed as: FELDMAN HAIM
45 granted patents·4 pending applications·325 citations·filing 1998–2024
98Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD34APPLIED MATERIALS INC9APPLIED MATERIALS ISREAL LTD1FELDMAN HAIM1KORNGUT DORON1
Top patents by PatentIndex Score
49 records- 0196US7630069B2Illumination system for optical inspectionAPPLIED MATERIALS INC·Filed 2006·Granted Dec 8, 2009·27 cites·8 claims
- 0294US10386311B1System and method for defect detection using multi-spot scanningAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Aug 20, 2019·10 cites·16 claims
- 0392US9535014B1Systems and methods for inspecting an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jan 3, 2017·8 cites·15 claims
- 0489US6124924AFocus error correction method and apparatusAPPLIED MATERIALS INC·Filed 1998·Granted Sep 26, 2000·73 cites·32 claims
- 0587US9810643B1System and method for defect detection using multi-spot scanningAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Nov 7, 2017·8 cites·13 claims
- 0686US7684048B2Scanning microscopyAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Mar 23, 2010·12 cites·14 claims
- 0785US7339661B2Dark field inspection systemKORNGUT DORON·Filed 2003·Granted Mar 4, 2008·28 cites·65 claims
- 0885US7187439B2High throughput inspection system and method for generating transmitted and/or reflected imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Mar 6, 2007·11 cites·18 claims
- 0983US6809808B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2002·Granted Oct 26, 2004·23 cites·25 claims
- 1080US7331033B2Simulation of aerial imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Feb 12, 2008·14 cites·13 claims
- 1179US7973919B2High resolution wafer inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2010·Granted Jul 5, 2011·3 cites·4 claims
- 1279US7030978B2System and method for inspection of a substrate that has a refractive indexAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Apr 18, 2006·17 cites·55 claims
- 1378US7924419B2Illumination system for optical inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2009·Granted Apr 12, 2011·3 cites·6 claims
- 1473US10481101B2Asymmetrical magnification inspection system and illumination moduleAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Nov 19, 2019·2 cites·14 claims
- 1572US11385188B1System and method for defect detection using multi-spot scanningAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 12, 2022·0 cites·18 claims
- 1672US7620932B2Simulation of aerial imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Nov 17, 2009·2 cites·9 claims
- 1772US6943898B2Apparatus and method for dual spot inspection of repetitive patternsAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Sep 13, 2005·10 cites·18 claims
- 1872US6930770B2High throughput inspection system and method for generating transmitted and/or reflected imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted Aug 16, 2005·9 cites·17 claims
- 1971US6853475B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2003·Granted Feb 8, 2005·11 cites·9 claims
- 2070US7379161B2Printer and a method for recording a multi-level imageAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted May 27, 2008·2 cites·40 claims
- 2169US8659754B2Inspection system and method for fast changes of focusAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Feb 25, 2014·2 cites·7 claims
- 2269US7053395B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2003·Granted May 30, 2006·10 cites·7 claims
- 2368US12436401B2Polarization optical systemAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Oct 7, 2025·0 cites·16 claims
- 2467US9012875B2Inspection method and an inspection system exhibiting speckle reduction characteristicsSHOHAM AMIR·Filed 2011·Granted Apr 21, 2015·1 cites·22 claims
- 2567US8488117B2Inspection system and method for fast changes of focusFELDMAN HAIM·Filed 2011·Granted Jul 16, 2013·3 cites·18 claims
- 2666US7002695B2Dual-spot phase-sensitive detectionAPPLIED MATERIALS INC·Filed 2002·Granted Feb 21, 2006·10 cites·24 claims
- 2765US7634754B2Simulation of aerial imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Dec 15, 2009·1 cites·15 claims
- 2865US2024280802A1Laser pulse cascadeAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 2963US8134699B2Illumination system for optical inspectionNAFTALI RON·Filed 2011·Granted Mar 13, 2012·1 cites·6 claims
- 3058US2025055241A1Pulse stretcher system and methodAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 3157US2025391707A1Method and system for 3d reconstruction of wafer structure by diagonal millingAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 3256US7714999B2High resolution wafer inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted May 11, 2010·0 cites·25 claims
- 3356US6937343B2Laser scanner with amplitude and phase detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted Aug 30, 2005·6 cites·16 claims
- 3455US11270432B1Inspection of a three dimensional structure of a sample using a phase shift maskAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Mar 8, 2022·0 cites·16 claims
- 3554US6794625B2Dynamic automatic focusing method and apparatus using interference patternsAPPLIED MATERIALS INC·Filed 2001·Granted Sep 21, 2004·4 cites·19 claims
- 3653US11815470B2Multi-perspective wafer analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Nov 14, 2023·0 cites·17 claims
- 3753US7518718B2High throughput inspection system and a method for generating transmitted and/or reflected imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Apr 14, 2009·0 cites·12 claims
- 3853US7053985B2Printer and a method for recording a multi-level imageAPPLIED MATERIALS ISREAL LTD·Filed 2003·Granted May 30, 2006·3 cites·40 claims
- 3953US6750436B2Focus error detection apparatus and method having dual focus error detection pathAPPLIED MATERIALS INC·Filed 2002·Granted Jun 15, 2004·4 cites·43 claims
- 4052US8228601B2Scanning microscopy using inhomogeneous polarizationMESHULACH DORON·Filed 2009·Granted Jul 24, 2012·2 cites·22 claims
- 4151US6671098B2Scanning angle expander and a method for expanding a scanning beam angleAPPLIED MATERIALS INC·Filed 2002·Granted Dec 30, 2003·3 cites·38 claims
- 4249US10060736B1Near-field sensor height controlAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Aug 28, 2018·0 cites·15 claims
- 4348US9395266B2On-tool wavefront aberrations measurement system and methodAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Jul 19, 2016·0 cites·15 claims
- 4448US7342218B2Methods and systems for optical inspection of surfaces based on laser screeningAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted Mar 11, 2008·2 cites·7 claims
- 4545US9835563B2Evaluation system and a method for evaluating a substrateAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Dec 5, 2017·0 cites·20 claims
- 4641US2020232934A1Multi-perspective wafer analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Application pending·0 cites
- 4740US10902582B2Computerized system and method for obtaining information about a region of an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jan 26, 2021·0 cites·18 claims
- 4840US7286239B2Laser scanner with amplitude and phase detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Oct 23, 2007·0 cites·1 claims
- 4937US7576348B2One-dimensional phase contrast microscopy with a traveling lens generated by a step function changeAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Aug 18, 2009·0 cites·36 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →