Inventor · disambiguated record
Hazem Hegazy
Also filed as: HEGAZY HAZEM · HEGAZY HAZEM MAHMOUD
7 granted patents·1 pending application·34 citations·filing 2004–2022
77Inventor score
Files withSIEMENS IND SOFTWARE INC4FOUAD FADY1HEGAZY HAZEM1HEGAZY HAZEM MAHMOUD1MENTOR GRAPHICS CORP1
Top patents by PatentIndex Score
8 records- 0186US11017147B2Edge-based camera for characterizing semiconductor layout designsMENTOR GRAPHICS CORP·Filed 2019·Granted May 25, 2021·5 cites·20 claims
- 0271US7340703B2Test structures and method for interconnect impedance property extractionHEGAZY HAZEM MAHMOUD·Filed 2004·Granted Mar 4, 2008·28 cites·54 claims
- 0350US11687695B2Shadow feature-based determination of capacitance values for integrated circuit (IC) layoutsSIEMENS IND SOFTWARE INC·Filed 2021·Granted Jun 27, 2023·0 cites·13 claims
- 0447US12299951B2Edge center point-based characterization of semiconductor layout designsSIEMENS IND SOFTWARE INC·Filed 2022·Granted May 13, 2025·0 cites·17 claims
- 0543US12032892B2Semiconductor layout context around a point of interestSIEMENS IND SOFTWARE INC·Filed 2019·Granted Jul 9, 2024·0 cites·20 claims
- 0641US12182487B2Controllable pattern clustering for characterized semiconductor layout designsSIEMENS IND SOFTWARE INC·Filed 2021·Granted Dec 31, 2024·0 cites·17 claims
- 0740US8356265B2Offset fillFOUAD FADY·Filed 2008·Granted Jan 15, 2013·1 cites·72 claims
- 0835US2012131532A1Substrate Noise Assessment Flow In Mixed-Signal And SOC DesignsHEGAZY HAZEM·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →