Inventor · disambiguated record
Haluk Konuk
Also filed as: KONUK HALUK
11 granted patents·1 pending application·210 citations·filing 1994–2005
92Inventor score
Top patents by PatentIndex Score
12 records- 0185US6380780B1Integrated circuit with scan flip-flopAGILENT TECHNOLOGIES INC·Filed 2000·Granted Apr 30, 2002·33 cites·19 claims
- 0283US6756827B2Clock multiplier using masked control of clock pulsesBROADCOM CORP·Filed 2002·Granted Jun 29, 2004·22 cites·18 claims
- 0376US5600787AMethod and data processing system for verifying circuit test vectorsMOTOROLA INC·Filed 1994·Granted Feb 4, 1997·42 cites·25 claims
- 0471US6771549B1Row-column repair technique for semiconductor memory arraysBROADCOM CORP·Filed 2003·Granted Aug 3, 2004·18 cites·23 claims
- 0569US5583787AMethod and data processing system for determining electrical circuit path delaysMOTOROLA INC·Filed 1994·Granted Dec 10, 1996·31 cites·28 claims
- 0668US7380189B2Circuit for PLL-based at-speed scan testingBROADCOM CORP·Filed 2004·Granted May 27, 2008·14 cites·11 claims
- 0768US7065693B2Implementation of test patterns in automated test equipmentBROADCOM CORP·Filed 2004·Granted Jun 20, 2006·13 cites·20 claims
- 0862US6940766B2Row-column repair technique for semiconductor memory arraysBROADCOM CORP·Filed 2004·Granted Sep 6, 2005·12 cites·8 claims
- 0948US6914459B2Clock multiplier using masked control of clock pulsesBROADCOM CORP·Filed 2004·Granted Jul 5, 2005·3 cites·8 claims
- 1046US5517506AMethod and data processing system for testing circuits using boolean differencesMOTOROLA INC·Filed 1994·Granted May 14, 1996·13 cites·26 claims
- 1141US5963046AMethod for detecting and locating open-circuit defects within digital CMOS integrated circuitsHEWLETT PACKARD CO·Filed 1997·Granted Oct 5, 1999·9 cites·9 claims
- 1240US2005218957A1Programmable frequency multiplierKONUK HALUK·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →