Inventor · disambiguated record
Haw-Jyue Luo
Also filed as: LUO HAW-JYUE
5 granted patents·1 pending application·33 citations·filing 2003–2015
77Inventor score
Top patents by PatentIndex Score
6 records- 0175US10140394B2Method for rejecting tuning disturbances to improve lamp failure prediction quality in thermal processesAPPLIED MATERIALS INC·Filed 2015·Granted Nov 27, 2018·4 cites·9 claims
- 0272US6959252B2Method for analyzing in-line QC test parametersPOWERCHIP SEMICONDUCTOR CORP·Filed 2003·Granted Oct 25, 2005·12 cites·18 claims
- 0360US9697470B2Apparatus and method for integrating manual and automated techniques for automated correlation in data miningAPPLIED MATERIALS INC·Filed 2014·Granted Jul 4, 2017·3 cites·17 claims
- 0459US6828776B2Method for analyzing defect inspection parametersPOWERCHIP SEMICONDUCTOR CORP·Filed 2003·Granted Dec 7, 2004·10 cites·10 claims
- 0551US6999897B2Method and related system for semiconductor equipment early warning managementPOWERCHIP SEMICONDUCTOR CORP·Filed 2004·Granted Feb 14, 2006·4 cites·14 claims
- 0637US2006048010A1Data analyzing method for a fault detection and classification systemTAI HUNG-EN·Filed 2004·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Haw-Jyue Luo files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →