Inventor · disambiguated record
Haruki Omine
Also filed as: OMINE HARUKI
0 granted patents·3 pending applications·0 citations·filing 2012–2024
Top patents by PatentIndex Score
3 records- 0160US2025013213A1Analysis apparatus, substrate processing system, substrate processing apparatus, analysis method, and analysis programTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 0243US2021073651A1Model generating method and model generating apparatusTOKYO ELECTRON LTD·Filed 2020·Application pending·0 cites
- 0336US2013056154A1Abnormality detecting unit and abnormality detecting methodNAKAYA MICHIKO·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →