Inventor · disambiguated record
Harish Reddy Singidi
Also filed as: SINGIDI HARISH · SINGIDI HARISH R · SINGIDI HARISH REDDY
142 granted patents·514 citations·filing 2015–2023
99Inventor score
Files withMICRON TECHNOLOGY INC132WESTERN DIGITAL TECH INC5SANDISK TECHNOLOGIES LLC3SANDISK TECHNOLOGIES INC2
Top patents by PatentIndex Score
142 records- 0199US11282564B1Selective wordline scans based on a data state metricMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 22, 2022·15 cites·20 claims
- 0299US10347344B2Read voltage calibration based on host IO operationsMICRON TECHNOLOGY INC·Filed 2017·Granted Jul 9, 2019·61 cites·31 claims
- 0398US10283205B2Preemptive idle time read scansMICRON TECHNOLOGY INC·Filed 2017·Granted May 7, 2019·34 cites·31 claims
- 0498US10121551B1Detecting power loss in NAND memory devicesMICRON TECHNOLOGY INC·Filed 2017·Granted Nov 6, 2018·42 cites·27 claims
- 0597US11106532B1Selective sampling of a data unit during a program erase cycle based on error rate change patternsMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 31, 2021·6 cites·20 claims
- 0697US10199111B1Memory devices with read level calibrationMICRON TECHNOLOGY INC·Filed 2017·Granted Feb 5, 2019·30 cites·27 claims
- 0796US10777284B2Read voltage calibration based on host IO operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 15, 2020·4 cites·24 claims
- 0896US10553290B1Read disturb scan consolidationMICRON TECHNOLOGY INC·Filed 2018·Granted Feb 4, 2020·18 cites·20 claims
- 0995US11417405B2Scan optimization from stacking multiple reliability specificationsMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 16, 2022·4 cites·20 claims
- 1095US11017870B1Select gate maintenance in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted May 25, 2021·7 cites·20 claims
- 1195US10365854B1Tracking data temperatures of logical block addressesMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 30, 2019·14 cites·25 claims
- 1295US10096370B1Voltage degradation aware NAND array managementMICRON TECHNOLOGY INC·Filed 2017·Granted Oct 9, 2018·13 cites·30 claims
- 1395US9785357B2Systems and methods for sampling data at a non-volatile memory systemSANDISK TECHNOLOGIES INC·Filed 2015·Granted Oct 10, 2017·35 cites·20 claims
- 1494US11735269B2Secure erase for data corruptionMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 22, 2023·2 cites·20 claims
- 1594US11709633B2Adjusting scan event thresholds to mitigate memory errorsMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 25, 2023·2 cites·20 claims
- 1694US10446237B1Temperature sensitive NAND programmingMICRON TECHNOLOGY INC·Filed 2018·Granted Oct 15, 2019·13 cites·15 claims
- 1793US11269553B2Adjusting scan event thresholds to mitigate memory errorsMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 8, 2022·3 cites·20 claims
- 1893US10522229B2Secure erase for data corruptionMICRON TECHNOLOGY INC·Filed 2017·Granted Dec 31, 2019·9 cites·16 claims
- 1992US11321173B2Managing storage of multiple plane parity data in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted May 3, 2022·3 cites·20 claims
- 2092US11314425B2Read error recoveryMICRON TECHNOLOGY INC·Filed 2019·Granted Apr 26, 2022·7 cites·19 claims
- 2192US11175979B2Prioritization of error control operations at a memory sub-systemMICRON TECHNOLOGY INC·Filed 2019·Granted Nov 16, 2021·6 cites·20 claims
- 2292US10672452B2Temperature informed memory refreshMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 2, 2020·7 cites·24 claims
- 2392US10387281B2Flash memory block retirement policyMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 20, 2019·10 cites·20 claims
- 2491US10789126B2Multiple memory devices having parity protectionMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 29, 2020·8 cites·21 claims
- 2591US10586602B2Read voltage calibration based on host IO operationsMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 10, 2020·6 cites·25 claims
- 2691US10380018B2Garbage collectionMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 13, 2019·6 cites·27 claims
- 2790US11287998B2Read count scaling factor for data integrity scanMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 29, 2022·5 cites·20 claims
- 2890US11238939B2Secure erase for data corruptionMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 1, 2022·2 cites·20 claims
- 2990US11200957B2Read disturb scan consolidationMICRON TECHNOLOGY INC·Filed 2021·Granted Dec 14, 2021·2 cites·20 claims
- 3090US11043278B2Read voltage calibration based on host IO operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 22, 2021·2 cites·20 claims
- 3190US10998034B2Temperature informed memory refreshMICRON TECHNOLOGY INC·Filed 2020·Granted May 4, 2021·2 cites·20 claims
- 3290US10325670B2Erase page checkMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 18, 2019·5 cites·20 claims
- 3389US11462279B1Modified distribution of memory device statesWESTERN DIGITAL TECH INC·Filed 2021·Granted Oct 4, 2022·2 cites·20 claims
- 3489US11031089B2Block read count voltage adjustmentMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 8, 2021·2 cites·20 claims
- 3589US10950317B2Read disturb scan consolidationMICRON TECHNOLOGY INC·Filed 2019·Granted Mar 16, 2021·4 cites·20 claims
- 3689US10796745B2Temperature informed memory refreshMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 6, 2020·2 cites·20 claims
- 3789US10719271B2Temperature correction in memory sub-systemsMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 21, 2020·4 cites·20 claims
- 3889US10096380B1Erase page checkMICRON TECHNOLOGY INC·Filed 2017·Granted Oct 9, 2018·7 cites·21 claims
- 3988US11037630B2NAND temperature data managementMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 15, 2021·2 cites·20 claims
- 4088US10691377B2Adjusting scan event thresholds to mitigate memory errorsMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 23, 2020·6 cites·20 claims
- 4187US11782627B2Read count scaling factor for data integrity scanMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 10, 2023·1 cites·20 claims
- 4287US10593412B2Using a status indicator in a memory sub-system to detect an eventMICRON TECHNOLOGY INC·Filed 2018·Granted Mar 17, 2020·5 cites·20 claims
- 4387US10354732B2NAND temperature data managementMICRON TECHNOLOGY INC·Filed 2017·Granted Jul 16, 2019·5 cites·30 claims
- 4487US9646709B2Proxy wordline stress for read disturb detectionSANDISK TECHNOLOGIES INC·Filed 2015·Granted May 9, 2017·7 cites·19 claims
- 4586US10915400B1Dynamic over provisioning allocation for purposed blocksMICRON TECHNOLOGY INC·Filed 2019·Granted Feb 9, 2021·3 cites·20 claims
- 4686US10679704B2NAND temperature data managementMICRON TECHNOLOGY INC·Filed 2019·Granted Jun 9, 2020·4 cites·24 claims
- 4786US9741444B2Proxy wordline stress for read disturb detectionSANDISK TECHNOLOGIES LLC·Filed 2017·Granted Aug 22, 2017·6 cites·7 claims
- 4885US11740805B2Selective relocation of data of a subset of a data block based on distribution of reliability statisticsMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 29, 2023·1 cites·20 claims
- 4985US11074989B2Uncorrectable ECCMICRON TECHNOLOGY INC·Filed 2017·Granted Jul 27, 2021·3 cites·24 claims
- 5084US11335394B2Temperature informed memory refreshMICRON TECHNOLOGY INC·Filed 2021·Granted May 17, 2022·1 cites·20 claims
Showing the top 50 of 142 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →