Inventor · disambiguated record
Hao Wei
Also filed as: WEI HAO · WEI HAO-CHIH
14 granted patents·7 pending applications·4 citations·filing 2004–2023
83Inventor score
Top patents by PatentIndex Score
21 records- 0179US10295567B2Probe module supporting loopback testMPI CORP·Filed 2016·Granted May 21, 2019·2 cites·6 claims
- 0273US12392803B2Probe card, method for designing probe card, method for producing tested semiconductor device method for testing unpackaged semiconductor by probe card, device under test and probe systemMPI CORP·Filed 2023·Granted Aug 19, 2025·0 cites·20 claims
- 0365US9759746B2Probe moduleMPI CORP·Filed 2014·Granted Sep 12, 2017·2 cites·6 claims
- 0452US2016018439A1Probe card, and connecting circuit board and signal feeding structure thereofMPI CORP·Filed 2015·Application pending·0 cites
- 0552US2016018441A1Probe card, and connecting circuit board and signal feeding structure thereofMPI CORP·Filed 2015·Application pending·0 cites
- 0650US9645197B2Method of operating testing systemMPI CORP·Filed 2014·Granted May 9, 2017·0 cites·11 claims
- 0748US10054627B2Testing jigMPI CORP·Filed 2014·Granted Aug 21, 2018·0 cites·5 claims
- 0847US10101362B2Probe module with high stabilityMPI CORP·Filed 2014·Granted Oct 16, 2018·0 cites·4 claims
- 0946US9759743B2Testing system and method for testing of electrical connectionsMPI CORP·Filed 2014·Granted Sep 12, 2017·0 cites·19 claims
- 1045US9410986B2Testing jigMPI CORP·Filed 2014·Granted Aug 9, 2016·0 cites·8 claims
- 1145US2015168454A1Probe moduleMPI CORP·Filed 2014·Application pending·0 cites
- 1243US9581676B2Method of calibrating and debugging testing systemMPI CORP·Filed 2014·Granted Feb 28, 2017·0 cites·9 claims
- 1341US11543430B2Probe assemblyMPI CORP·Filed 2021·Granted Jan 3, 2023·0 cites·10 claims
- 1441US9470716B2Probe moduleMPI CORP·Filed 2014·Granted Oct 18, 2016·0 cites·10 claims
- 1539US9835651B2Cantilever type probe card for high frequency signal transmissionMPI CORP·Filed 2015·Granted Dec 5, 2017·0 cites·14 claims
- 1639US2006068729A1Portable device utilizing vehicle audio system for playing music of specific formatACTION ENTPR CO LTD·Filed 2004·Application pending·0 cites
- 1737US2017115326A1Probe moduleMPI CORP·Filed 2016·Application pending·0 cites
- 1836US2015168531A1Calibration plateMPI CORP·Filed 2014·Application pending·0 cites
- 1936US2016305981A1Probe CardMPI CORP·Filed 2016·Application pending·0 cites
- 2035US9880252B2Method of calibrating and debugging testing systemMPI CORP·Filed 2017·Granted Jan 30, 2018·0 cites·25 claims
- 2133US10753960B2Probe card and signal path switching module assemblyMPI CORP·Filed 2018·Granted Aug 25, 2020·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →