Inventor · disambiguated record

Han-Lin Zeng

Also filed as: Zeng han-lin

1 granted patent·10 citations·filing 2016–2016

32Inventor score

Technology areasH10W

Files withUNITED MICROELECTRONICS CORP1

Top patents by PatentIndex Score

1 record

0189US9653404B1Overlay target for optically measuring overlay alignment of layers formed on semiconductor waferUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 16, 2017·10 cites·20 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →