Inventor · disambiguated record
Heng-Yi Chang
Also filed as: CHANG HENG Y · CHANG HENG-YI
3 granted patents·12 pending applications·5 citations·filing 2003–2024
54Inventor score
Top patents by PatentIndex Score
15 records- 0157US2025216262A1Multiple-wavelength reflective raman probe and raman spectra detection deviceUNIV NAT TAIWAN SCIENCE & TECHNOLOGY·Filed 2024·Application pending·0 cites
- 0249US7573277B2Thin film probe cardWINTEK CORP·Filed 2006·Granted Aug 11, 2009·0 cites·20 claims
- 0349US6924595B2Damping and muffling structure for EL cellWINTEK CORP·Filed 2003·Granted Aug 2, 2005·5 cites·3 claims
- 0447US2014071637A1Touch panel and touch display deviceWINTEK CORP·Filed 2013·Application pending·0 cites
- 0543US2006154102A1Soft thin laminated substrateWANG CHIH-YUAN·Filed 2005·Application pending·0 cites
- 0642US2007076389A1Electronic device with conductive connection structureWINTEK CORP·Filed 2006·Application pending·0 cites
- 0740US8951921B2Method of forming thin film poly silicon layer and method of forming thin film transistorWINTEK CORP·Filed 2013·Granted Feb 10, 2015·0 cites·24 claims
- 0839US2014063425A1Liquid crystal display panel and liquid crystal display apparatusINNOLUX CORP·Filed 2013·Application pending·0 cites
- 0938US2007241435A1Optical display package and the method thereofWINTEK CORP·Filed 2006·Application pending·0 cites
- 1037US2014087527A1Method of forming thin film poly silicon layer and method of forming thin film transistorWINTEK CORP·Filed 2013·Application pending·0 cites
- 1137US2013201348A1Capacitive touch panelWINTEK CHINA TECHNOLOGY LTD·Filed 2013·Application pending·0 cites
- 1236US2013330934A1Method of forming thin film poly silicon layerWINTEK CORP·Filed 2013·Application pending·0 cites
- 1334US2005012693A1Damping and muffling structure for EL cellFiled 2003·Application pending·0 cites
- 1433US2006145712A1Contact-type film probeWANG CHIH Y·Filed 2005·Application pending·0 cites
- 1530US2006132152A1Contact-type film probeWANG CHIH Y·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →