Inventor · disambiguated record
Henry Jim Fulford
Also filed as: FULFORD HENRY J · FULFORD HENRY JIM · FULFORD JR HENRY J
14 granted patents·11 pending applications·180 citations·filing 1992–2024
91Inventor score
Files withTOKYO ELECTRON LTD12ADVANCED MICRO DEVICES INC6MICRON TECHNOLOGY INC3KHOUEIR ANTOINE1MIKHALEV VLADIMIR1
Top patents by PatentIndex Score
25 records- 0181US5296411AMethod for achieving an ultra-reliable thin oxide using a nitrogen annealADVANCED MICRO DEVICES INC·Filed 1993·Granted Mar 22, 1994·51 cites·25 claims
- 0279US8154088B1Semiconductor topography and method for reducing gate induced drain leakage (GIDL) in MOS transistorsKHOUEIR ANTOINE·Filed 2007·Granted Apr 10, 2012·10 cites·13 claims
- 0377US9406623B2Electromagnetic shield and associated methodsMICRON TECHNOLOGY INC·Filed 2014·Granted Aug 2, 2016·3 cites·11 claims
- 0470US8853833B2Electromagnetic shield and associated methodsMIKHALEV VLADIMIR·Filed 2011·Granted Oct 7, 2014·2 cites·23 claims
- 0570US5538923AMethod for achieving a high quality thin oxide using a sacrificial oxide annealADVANCED MICRO DEVICES INC·Filed 1994·Granted Jul 23, 1996·39 cites·12 claims
- 0666US5316981AMethod for achieving a high quality thin oxide using a sacrificial oxide annealADVANCED MICRO DEVICES INC·Filed 1992·Granted May 31, 1994·34 cites·13 claims
- 0763US12435964B2Contactless capacitive measurement tool with improved throughput and accuracyTOKYO ELECTRON LTD·Filed 2023·Granted Oct 7, 2025·0 cites·23 claims
- 0863US5362685AMethod for achieving a high quality thin oxide in integrated circuit devicesADVANCED MICRO DEVICES INC·Filed 1992·Granted Nov 8, 1994·26 cites·16 claims
- 0963US2025098174A1Nanosheet 3d transistor for advanced memory elementsTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1063US2025133741A1Three-dimensional ferroelectric memory device and methods of fabricating the sameTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1160US2025169178A13d fet devices and methods for manufacturing the sameTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1260US2025068823A1Circuit design modeling for bonding integrated circuitsTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1360US2025098188A1Symmetrical 3d bipolar nanosheet transistorTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1459US2025123090A1Device and method for determining wafer bowTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 1559US2025133743A1Ferroelectric 3d memory block unitTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1658US8815667B2Transistors with an extension region having strips of differing conductivity type and methods of forming the sameSMITH MICHAEL·Filed 2009·Granted Aug 26, 2014·0 cites·23 claims
- 1758US2025233108A1Plurality of advanced multilevel circuit attachmentsTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1857US2025040202A1Methods and devices for vertical connection with internal epitaxial structureTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 1956US9337333B2Transistors with an extension region having strips of differing conductivity typeMICRON TECHNOLOGY INC·Filed 2014·Granted May 10, 2016·0 cites·20 claims
- 2056US2025056810A1Semiconductor devices with vertical transistors and ferroelectric capacitorsTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 2155US2025031400A1Forksheet semiconductor devices and methods of fabricating the sameTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 2254US9991210B2Electromagnetic shield and associated methodsMICRON TECHNOLOGY INC·Filed 2016·Granted Jun 5, 2018·0 cites·13 claims
- 2339US8969928B2Transistors having a control gate and one or more conductive structuresSMITH MIKE·Filed 2010·Granted Mar 3, 2015·0 cites·33 claims
- 2439US5350492AOxide removal method for improvement of subsequently grown oxidesADVANCED MICRO DEVICES INC·Filed 1992·Granted Sep 27, 1994·11 cites·16 claims
- 2532US5350491AOxide removal method for improvement of subsequently grown oxides for a twin-tub CMOS processADVANCED MICRO DEVICES INC·Filed 1992·Granted Sep 27, 1994·4 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →