Inventor · disambiguated record
Heiko-Ulrich Klaus Kempe
Also filed as: KEMPE HEIKO · KEMPE HEIKO-ULRICH KLAUS
2 granted patents·48 citations·filing 1995–2021
56Inventor score
Top patents by PatentIndex Score
2 records- 0153US6075880AMethod for detection of defects in the inspection of structured surfacesJENOPTIK TECHNOLOGIE GMBH·Filed 1995·Granted Jun 13, 2000·48 cites·22 claims
- 0234US12387297B2Method and device for reducing aliasing errors in images of pixel-based display devices and for the evaluation of display devices of this typeTechnoTeam Holding GmbH·Filed 2021·Granted Aug 12, 2025·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →