Inventor · disambiguated record
Hendrik Kersten
Also filed as: KERSTEN HENDRIK
1 granted patent·2 pending applications·2 citations·filing 2010–2025
19Inventor score
Top patents by PatentIndex Score
3 records- 0157US8481927B2High yield atmospheric pressure ion source for ion spectrometers in vacuumFRANZEN JOCHEN·Filed 2010·Granted Jul 9, 2013·2 cites·16 claims
- 0249US2025174452A1Residual gas analyser, projection exposure apparatus comprising a residual gas analyser and method of residual gas analysisZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0349US2025166983A1Residual gas analyser, projection exposure apparatus comprising a residual gas analyser and method of residual gas analysisZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →