Inventor · disambiguated record
Herbert Lammering
Also filed as: LAMMERING HERBERT
3 granted patents·85 citations·filing 1999–2000
73Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0174US6496958B1Yield prediction and statistical process control using predicted defect related yield lossINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted Dec 17, 2002·52 cites·34 claims
- 0260US6367040B1System and method for determining yield impact for semiconductor devicesSIEMENS AG·Filed 1999·Granted Apr 2, 2002·27 cites·18 claims
- 0351US6434725B1Method and system for semiconductor testing using yield correlation between global and class parametersINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Aug 13, 2002·6 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →