Inventor · disambiguated record
Heng-Yuan Lee
Also filed as: LEE HENG · LEE HENG-YUAN
22 granted patents·8 pending applications·631 citations·filing 2006–2020
94Inventor score
Top patents by PatentIndex Score
30 records- 0197US7405166B2Method of manufacturing charge storage deviceIND TECH RES INST·Filed 2006·Granted Jul 29, 2008·550 cites·23 claims
- 0296US11625588B2Neuron circuit and artificial neural network chipIND TECH RES INST·Filed 2020·Granted Apr 11, 2023·8 cites·10 claims
- 0395US11017830B1Ferroelectric memoriesIND TECH RES INST·Filed 2020·Granted May 25, 2021·12 cites·23 claims
- 0493US8642985B2Memory CellCHEN FREDERICK T·Filed 2011·Granted Feb 4, 2014·20 cites·22 claims
- 0584US8817521B2Control method for memory cellCHEN YU-SHENG·Filed 2012·Granted Aug 26, 2014·12 cites·31 claims
- 0682US10074533B1Structure of epitaxial wafer and method of fabricating the sameIND TECH RES INST·Filed 2017·Granted Sep 11, 2018·4 cites·7 claims
- 0782US9142776B2Resistive random access memory and method for fabricating the sameIND TECH RES INST·Filed 2012·Granted Sep 22, 2015·3 cites·56 claims
- 0877US11145356B2Computation operator in memory and operation method thereofIND TECH RES INST·Filed 2020·Granted Oct 12, 2021·1 cites·13 claims
- 0972US8198620B2Resistance switching memoryCHEN FREDERICK T·Filed 2009·Granted Jun 12, 2012·5 cites·19 claims
- 1071US9373789B2Resistive random access memory and method for fabricating the sameIND TECH RES INST·Filed 2014·Granted Jun 21, 2016·1 cites·43 claims
- 1169US10833091B2Ferroelectric memoriesIND TECH RES INST·Filed 2019·Granted Nov 10, 2020·1 cites·16 claims
- 1268US7851843B2DRAM cylindrical capacitorIND TECH RES INST·Filed 2008·Granted Dec 14, 2010·3 cites·12 claims
- 1366US10014375B1III-nitride based semiconductor structureIND TECH RES INST·Filed 2017·Granted Jul 3, 2018·1 cites·18 claims
- 1465US7332393B2Method of fabricating a cylindrical capacitorIND TECH RES INST·Filed 2006·Granted Feb 19, 2008·3 cites·10 claims
- 1564US7799653B2Method for forming capacitor in dynamic random access memoryIND TECH RES INST·Filed 2008·Granted Sep 21, 2010·3 cites·11 claims
- 1663US9385314B2Memory cell of resistive random access memory and manufacturing method thereofIND TECH RES INST·Filed 2014·Granted Jul 5, 2016·1 cites·16 claims
- 1757US7456065B2Fabricating method of DRAM cylindrical capacitorIND TECH RES INST·Filed 2006·Granted Nov 25, 2008·1 cites·6 claims
- 1850US11217661B2Ferroelectric memoriesIND TECH RES INST·Filed 2020·Granted Jan 4, 2022·0 cites·20 claims
- 1950US2015280122A1Resistive random access memory and method for fabricating the sameIND TECH RES INST·Filed 2015·Application pending·0 cites
- 2049US2021004678A1Neural circuitIND TECH RES INST·Filed 2020·Application pending·0 cites
- 2147US8223528B2Control method for memory cellCHEN YU-SHENG·Filed 2009·Granted Jul 17, 2012·2 cites·28 claims
- 2247US2013105758A1Memory cell of resistive random access memory and manufacturing method thereofIND TECH RES INST·Filed 2012·Application pending·0 cites
- 2347US2008094776A1Cylindrical capacitorIND TECH RES INST·Filed 2007·Application pending·0 cites
- 2444US2020083332A1Semiconductor device and method for fabricating the sameIND TECH RES INST·Filed 2019·Application pending·0 cites
- 2544US2009114899A1Resistance memory and method for manufacturing the sameIND TECH RES INST·Filed 2008·Application pending·0 cites
- 2637US8711601B2Resistive random access memory cell and resistive random access memory moduleCHEN FREDERICK T·Filed 2011·Granted Apr 29, 2014·0 cites·26 claims
- 2737US2018211997A1Structure of random access memoryIND TECH RES INST·Filed 2017·Application pending·0 cites
- 2835US10170580B2Structure of GaN-based transistor and method of fabricating the sameIND TECH RES INST·Filed 2017·Granted Jan 1, 2019·0 cites·20 claims
- 2933US2014077149A1Resistance memory cell, resistance memory array and method of forming the sameCHEN FREDERICK T·Filed 2012·Application pending·0 cites
- 3031US8750016B2Resistive memory and program verification method thereofLEE HENG-YUAN·Filed 2011·Granted Jun 10, 2014·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →