Inventor · disambiguated record
Heonju Shin
Also filed as: SHIN HEONJU
1 granted patent·2 pending applications·0 citations·filing 2022–2025
5Inventor score
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3 records- 0172US2025225674A1Semiconductor measurement methodSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0261US2023114817A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 0355US12190498B2Print check repeater defect detectionKLA CORP·Filed 2022·Granted Jan 7, 2025·0 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →