Inventor · disambiguated record
Hendrik Gezinus Tappel
Also filed as: TAPPEL HENDRIK G · TAPPEL HENDRIK GEZINUS
11 granted patents·2 pending applications·229 citations·filing 1991–2015
92Inventor score
Top patents by PatentIndex Score
13 records- 0194US7408178B2Method for the removal of a microscopic sample from a substrateFEI CO·Filed 2005·Granted Aug 5, 2008·26 cites·16 claims
- 0294US6963068B2Method for the manufacture and transmissive irradiation of a sample, and particle-optical systemFEI CO·Filed 2004·Granted Nov 8, 2005·72 cites·40 claims
- 0392US7906762B2Compact scanning electron microscopeFEI CO·Filed 2007·Granted Mar 15, 2011·25 cites·16 claims
- 0491US8309921B2Compact scanning electron microscopeBIERHOFF MARTINUS PETRUS MARIA·Filed 2011·Granted Nov 13, 2012·17 cites·7 claims
- 0589US7474419B2Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatusFEI CO·Filed 2006·Granted Jan 6, 2009·23 cites·20 claims
- 0688US8354587B2Hermetically sealed housing with electrical feed-inFEI CO·Filed 2006·Granted Jan 15, 2013·17 cites·20 claims
- 0788US7005636B2Method and apparatus for manipulating a microscopic sampleFEI CO·Filed 2004·Granted Feb 28, 2006·32 cites·22 claims
- 0885US7301157B2Cluster tool for microscopic processing of samplesFEI CO·Filed 2005·Granted Nov 27, 2007·10 cites·18 claims
- 0980US9865427B2User interface for an electron microscopeFEI CO·Filed 2015·Granted Jan 9, 2018·2 cites·16 claims
- 1070US9025018B2User interface for an electron microscopeBIERHOFF MARTINUS PETRUS MARIA·Filed 2007·Granted May 5, 2015·2 cites·21 claims
- 1140US2006017016A1Method for the removal of a microscopic sample from a substrateFEI CO·Filed 2005·Application pending·0 cites
- 1236US5093578AValve device for a particle beam apparatusPHILIPS CORP·Filed 1991·Granted Mar 3, 1992·3 cites·12 claims
- 1336US2005054115A1Method of expeditiously using a focused-beam apparatus to extract samples for analysis from workpiecesFEI CO·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →