Inventor · disambiguated record
Hiroaki Agawa
Also filed as: Agawa Hiroaki
3 granted patents·2 pending applications·0 citations·filing 2021–2025
39Inventor score
Files withTOKYO ELECTRON LTD5
Top patents by PatentIndex Score
5 records- 0160US12354898B2Stage, testing apparatus, and stage operating methodTOKYO ELECTRON LTD·Filed 2022·Granted Jul 8, 2025·0 cites·17 claims
- 0258US2025334456A1Inspection System and Temperature Control MethodTOKYO ELECTRON LTD·Filed 2025·Application pending·0 cites
- 0357US2025290951A1Stage, test apparatus, and method for operating stageTOKYO ELECTRON LTD·Filed 2025·Application pending·0 cites
- 0454US11768236B2Test device control method and test deviceTOKYO ELECTRON LTD·Filed 2021·Granted Sep 26, 2023·0 cites·8 claims
- 0547US12075537B2Control method of inspection apparatus and inspection apparatusTOKYO ELECTRON LTD·Filed 2021·Granted Aug 27, 2024·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →