Inventor · disambiguated record
Hidemitsu Asano
Also filed as: ASANO HIDEMITSU
18 granted patents·1 pending application·27 citations·filing 2003–2020
89Inventor score
Top patents by PatentIndex Score
19 records- 0189US10190996B2Method and device for controlling rotary tableMITUTOYO CORP·Filed 2016·Granted Jan 29, 2019·4 cites·1 claims
- 0284US10753887B2X-ray CT measuring apparatus and interference prevention method thereofMITUTOYO CORP·Filed 2019·Granted Aug 25, 2020·2 cites·8 claims
- 0384US8891090B2Light-interference measuring apparatusNAGAHAMA TATSUYA·Filed 2011·Granted Nov 18, 2014·9 cites·5 claims
- 0477US10295337B2Surface texture measuring apparatusMITUTOYO CORP·Filed 2017·Granted May 21, 2019·2 cites·11 claims
- 0569US11037337B2Method and apparatus for generating measurement plan for measuring X-ray CTMITUTOYO CORP·Filed 2019·Granted Jun 15, 2021·1 cites·7 claims
- 0659US8008610B2Illumination light quantity setting method in image measuring instrumentMITUTOYO CORP·Filed 2008·Granted Aug 30, 2011·3 cites·5 claims
- 0758US11041818B2Dimensional X-ray computed tomography system and CT reconstruction method using sameMITUTOYO CORP·Filed 2019·Granted Jun 22, 2021·0 cites·10 claims
- 0858US10618220B2Object-forming machine, cross-section measurement apparatus, and cross-section measurement methodMITUTOYO CORP·Filed 2019·Granted Apr 14, 2020·0 cites·1 claims
- 0955US11333619B2Measurement X-ray CT apparatusMITUTOYO CORP·Filed 2020·Granted May 17, 2022·0 cites·11 claims
- 1053US11510643B2Calibration method and apparatus for measurement X-ray CT apparatus, measurement method and apparatus using the same, and measurement X-ray CT apparatusMITUTOYO CORP·Filed 2020·Granted Nov 29, 2022·0 cites·12 claims
- 1152US11234670B2Measuring X-ray CT apparatus and tomographic image generating methodMITUTOYO CORP·Filed 2019·Granted Feb 1, 2022·0 cites·6 claims
- 1252US10343334B2Object-forming machine, cross-section measurement apparatus, and cross-section measurement methodMITUTOYO CORP·Filed 2016·Granted Jul 9, 2019·0 cites·7 claims
- 1351US7420588B2Measuring method, measuring system and storage mediumMITUTOYO CORP·Filed 2003·Granted Sep 2, 2008·6 cites·7 claims
- 1449US11262319B2Measuring X-ray CT apparatus and production work piece measurement methodMITUTOYO CORP·Filed 2019·Granted Mar 1, 2022·0 cites·10 claims
- 1547US2019223826A1X-ray ct measuring apparatus and calibration method thereofMITUTOYO CORP·Filed 2019·Application pending·0 cites
- 1642US10102631B2Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting programMITUTOYO CORP·Filed 2016·Granted Oct 16, 2018·0 cites·6 claims
- 1741US8316553B2Coordinate measuring machineMATSUMIYA SADAYUKI·Filed 2010·Granted Nov 27, 2012·0 cites·1 claims
- 1838US8681341B2Shape measuring method and shape measuring apparatusGOTO TOMONORI·Filed 2011·Granted Mar 25, 2014·0 cites·17 claims
- 1938US8680428B2Slit width adjusting device and microscope laser processing apparatusASANO HIDEMITSU·Filed 2009·Granted Mar 25, 2014·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →