Inventor · disambiguated record
Hisafumi Iwata
Also filed as: IWATA HISAFUMI
16 granted patents·2 pending applications·714 citations·filing 1988–2012
95Inventor score
Top patents by PatentIndex Score
18 records- 0193US8319960B2Defect inspection systemAIKO KENJI·Filed 2010·Granted Nov 27, 2012·19 cites·12 claims
- 0292US5278012AMethod for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrateHITACHI LTD·Filed 1992·Granted Jan 11, 1994·237 cites·23 claims
- 0388US7426023B2Method and apparatus for detecting defectsHITACHI LTD·Filed 2005·Granted Sep 16, 2008·13 cites·15 claims
- 0488US5684565APattern detecting method, pattern detecting apparatus, projection exposing apparatus using the same and exposure systemHITACHI LTD·Filed 1994·Granted Nov 4, 1997·57 cites·33 claims
- 0588US5293538AMethod and apparatus for the inspection of defectsHITACHI LTD·Filed 1991·Granted Mar 8, 1994·80 cites·6 claims
- 0687US5059559AMethod of aligning and bonding tab inner leadsHITACHI LTD·Filed 1988·Granted Oct 22, 1991·88 cites·21 claims
- 0785US6826735B2Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor deviceHITACHI LTD·Filed 2002·Granted Nov 30, 2004·34 cites·17 claims
- 0883US6775817B2Inspection system and semiconductor device manufacturing methodHITACHI LTD·Filed 2001·Granted Aug 10, 2004·37 cites·8 claims
- 0983US6611728B1Inspection system and method for manufacturing electronic devices using the inspection systemHITACHI LTD·Filed 1999·Granted Aug 26, 2003·71 cites·17 claims
- 1075US8804109B2Defect inspection systemHITACHI HIGH TECH CORP·Filed 2012·Granted Aug 12, 2014·2 cites·6 claims
- 1174US7733474B2Defect inspection systemHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 8, 2010·3 cites·14 claims
- 1272US8428336B2Inspecting method, inspecting system, and method for manufacturing electronic devicesIKEDA YOKO·Filed 2006·Granted Apr 23, 2013·7 cites·13 claims
- 1371US6539272B1Electric device inspection method and electric device inspection systemHITACHI LTD·Filed 2000·Granted Mar 25, 2003·10 cites·5 claims
- 1470US6687633B2Inspection system, inspection apparatus, inspection program, and production method of semiconductor devicesHITACHI LTD·Filed 2002·Granted Feb 3, 2004·13 cites·8 claims
- 1562US7068834B1Inspecting method, inspecting system, and method for manufacturing electronic devicesHITACHI LTD·Filed 1999·Granted Jun 27, 2006·35 cites·34 claims
- 1662US6928375B2Inspection condition setting program, inspection device and inspection systemHITACHI HIGH TECH CORP·Filed 2003·Granted Aug 9, 2005·8 cites·14 claims
- 1744US2005195396A1Inspection condition setting program, inspection device and inspection systemHITACHI HIGH TECH CORP·Filed 2005·Application pending·0 cites
- 1843US2005264797A1Method and apparatus for detecting defectsNAKANO HIROYUKI·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →