Inventor · disambiguated record
Hirofumi Kadono
Also filed as: KADONO HIROFUMI
1 granted patent·1 pending application·8 citations·filing 2003–2003
32Inventor score
Technology areasG01B
Files withPRESIDENT OF SAITAMA UNIVERSIT2
Top patents by PatentIndex Score
2 records- 0142US6943870B2Deformation measuring method and apparatus using electronic speckle pattern interferometryPRESIDENT OF SAITAMA UNIVERSIT·Filed 2003·Granted Sep 13, 2005·8 cites·8 claims
- 0220US2004059526A1Deformation measuring method and apparatus using electronic speckle pattern interferometryPRESIDENT OF SAITAMA UNIVERSIT·Filed 2003·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Hirofumi Kadono files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →