Inventor · disambiguated record
Hideki Kikuchi
Also filed as: KIKUCHI HIDEKI
17 granted patents·7 pending applications·70 citations·filing 1997–2021
91Inventor score
Files withHITACHI HIGH TECH CORP10TOKUYAMA CORP4NISSEI ELECTRIC CO LTD2TSUNETA RURIKO2KIKUCHI HIDEKI1
Top patents by PatentIndex Score
24 records- 0188US7863564B2Electric charged particle beam microscope and microscopyHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 4, 2011·13 cites·7 claims
- 0281US8993961B2Electric charged particle beam microscope and electric charged particle beam microscopyTSUNETA RURIKO·Filed 2011·Granted Mar 31, 2015·6 cites·10 claims
- 0381US6717494B2Printed-circuit board, coaxial cable, and electronic deviceNEC TOPPAN CIRCUIT SOLUTIONS·Filed 2002·Granted Apr 6, 2004·32 cites·23 claims
- 0474US8039072B2Gas tank and method for producing the sameTOYOTA MOTOR CO LTD·Filed 2006·Granted Oct 18, 2011·2 cites·18 claims
- 0565US11164717B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 2, 2021·1 cites·2 claims
- 0665US8963102B2Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopyHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 24, 2015·1 cites·15 claims
- 0758US10636621B2Charged particle beam device for moving an aperture having plurality of openings and sample observation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 28, 2020·1 cites·4 claims
- 0858US7688027B2Portable battery charger to charge plural batteriesSONY CORP·Filed 2007·Granted Mar 30, 2010·4 cites·14 claims
- 0957US8928485B2Charged corpuscular ray apparatusKIKUCHI HIDEKI·Filed 2009·Granted Jan 6, 2015·2 cites·10 claims
- 1056US10192713B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jan 29, 2019·1 cites·8 claims
- 1154US6852885B2Production method of high purity organic compoundTOKUYAMA CORP·Filed 2001·Granted Feb 8, 2005·1 cites·10 claims
- 1251US2024266141A1Sample Holder and Analysis SystemHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1349US10661497B2Heat shrink tube and method for producing the sameNISSEI ELECTRIC CO LTD·Filed 2016·Granted May 26, 2020·0 cites·14 claims
- 1446US6770777B2Process for producing 2-alkyl-2-adamantyl esterTOKUYAMA CORP·Filed 2001·Granted Aug 3, 2004·0 cites·4 claims
- 1544US2024186103A1Transmission Electron MicroscopeHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1641US12313191B2Heat shrink tube and method for forming sameNISSEI ELECTRIC CO LTD·Filed 2020·Granted May 27, 2025·0 cites·12 claims
- 1740US5883160AFlame-retardant epoxy resin composition for case potting of film capacitorsSOMAR CORP·Filed 1997·Granted Mar 16, 1999·6 cites·7 claims
- 1840US2015041676A1Soundproof cover for charged-particle beam device, and charged-particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1938US7026504B2Process for preparing alkyladamantyl esters and compositionsTOKUYAMA CORP·Filed 2001·Granted Apr 11, 2006·0 cites·11 claims
- 2038US2020357601A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Application pending·0 cites
- 2136US6781016B2Process for the preparation of alicyclic ketones and an alkyl-substituted alicyclic estersTOKUYAMA CORP·Filed 2001·Granted Aug 24, 2004·0 cites·2 claims
- 2236US2014103273A1Resin Tube for Guide Wire, Method for Manufacturing Resin Tube for Guide Wire, and Guide WireNAKAJIMA TETSUYA·Filed 2012·Application pending·0 cites
- 2335US2012104253A1Charged particle beam microscope and measuring method using sameTSUNETA RURIKO·Filed 2010·Application pending·0 cites
- 2435US2015243472A1Electron Microscope and Sample Movement DeviceHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →