Inventor · disambiguated record
Hiroyuki Kobatake
Also filed as: KOBATAKE HIROYUKI
52 granted patents·3 pending applications·817 citations·filing 1985–2015
98Inventor score
Top patents by PatentIndex Score
55 records- 0197US4847808ARead only semiconductor memory having multiple bit cellsNEC CORP·Filed 1987·Granted Jul 11, 1989·145 cites·7 claims
- 0294US4937787AProgrammable read only memory with means for discharging bit line before program verifying operationNEC CORP·Filed 1988·Granted Jun 26, 1990·88 cites·8 claims
- 0389US9263119B2Semiconductor device having memory cell with electrostatic capacitance circuitRENESAS ELECTRONICS CORP·Filed 2013·Granted Feb 16, 2016·10 cites·24 claims
- 0485US5729155AHigh voltage CMOS circuit which protects the gate oxides from excessive voltagesNEC CORP·Filed 1995·Granted Mar 17, 1998·52 cites·12 claims
- 0582US5499183AConstant voltage generating circuit having step-up circuitNEC CORP·Filed 1994·Granted Mar 12, 1996·62 cites·6 claims
- 0677US8592942B2Non-volatile semiconductor memory deviceKODAMA NORIAKI·Filed 2009·Granted Nov 26, 2013·5 cites·23 claims
- 0775US9202553B2Semiconductor storage deviceRENESAS ELECTRONICS CORP·Filed 2014·Granted Dec 1, 2015·3 cites·12 claims
- 0875US5815441ANon-volatile semiconductor memory deviceNEC CORP·Filed 1997·Granted Sep 29, 1998·35 cites·5 claims
- 0974US6204724B1Reference voltage generation circuit providing a stable output voltageNEC CORP·Filed 1999·Granted Mar 20, 2001·29 cites·5 claims
- 1074US5066870ACharge pump having pull-up circuit operating with two clock pulse sequencesNEC CORP·Filed 1990·Granted Nov 19, 1991·26 cites·12 claims
- 1173US7518936B2Semiconductor integrated circuit device and inspection method of the sameNEC ELECTRONICS CORP·Filed 2006·Granted Apr 14, 2009·8 cites·22 claims
- 1271US4749880ACircuit for detecting level of input voltageNEC CORP·Filed 1985·Granted Jun 7, 1988·19 cites·5 claims
- 1366US8149640B2Differential sense amplifierKOBATAKE HIROYUKI·Filed 2010·Granted Apr 3, 2012·3 cites·9 claims
- 1466US8143910B2Semiconductor integrated circuit and method of testing the sameKOBATAKE HIROYUKI·Filed 2009·Granted Mar 27, 2012·4 cites·11 claims
- 1565US5057722ADelay circuit having stable delay timeNEC CORP·Filed 1990·Granted Oct 15, 1991·19 cites·8 claims
- 1664US6084387APower source circuit for generating positive and negative voltage sourcesNEC CORP·Filed 1999·Granted Jul 4, 2000·31 cites·6 claims
- 1763US8446163B2Test circuit and test method for testing differential input circuitKOBATAKE HIROYUKI·Filed 2010·Granted May 21, 2013·1 cites·15 claims
- 1862US8432747B2Static random access memory (SRAM) and test method of the SRAM having precharge circuit to prepcharge bit lineKOBATAKE HIROYUKI·Filed 2012·Granted Apr 30, 2013·2 cites·20 claims
- 1962US7911870B2Fuse data read circuit having control circuit between fuse and current mirror circuitRENESAS ELECTRONICS CORP·Filed 2009·Granted Mar 22, 2011·4 cites·9 claims
- 2062US5281870ACurrent controllerNEC CORP·Filed 1992·Granted Jan 25, 1994·13 cites·4 claims
- 2162US4947378AMemory element exchange control circuit capable of automatically refreshing a defective addressNEC CORP·Filed 1988·Granted Aug 7, 1990·20 cites·9 claims
- 2261US5880995ANonvolatile semiconductor storage including main decoder with predecoderNEC CORP·Filed 1998·Granted Mar 9, 1999·21 cites·7 claims
- 2360US8144523B2Semiconductor storage deviceKOBATAKE HIROYUKI·Filed 2010·Granted Mar 27, 2012·2 cites·8 claims
- 2460US5844847AMethod and Nonvolatile semiconductor memory for repairing over-erased cellsNEC CORP·Filed 1996·Granted Dec 1, 1998·19 cites·24 claims
- 2559US4788460ACircuit arrangement of sense amplifier for rapid evaluation of logic stateNEC CORP·Filed 1987·Granted Nov 29, 1988·12 cites·7 claims
- 2658US5892258ARead-only semiconductor memory deviceNEC CORP·Filed 1997·Granted Apr 6, 1999·18 cites·11 claims
- 2754US8824189B2Semiconductor deviceKOBATAKE HIROYUKI·Filed 2012·Granted Sep 2, 2014·1 cites·9 claims
- 2854US8085610B2SRAM and testing method of SRAMKOBATAKE HIROYUKI·Filed 2010·Granted Dec 27, 2011·1 cites·12 claims
- 2951US5459349ASemiconductor device with reduced noise propagation between circuit blocksNEC CORP·Filed 1994·Granted Oct 17, 1995·13 cites·7 claims
- 3051US4924438ANon-volatile semiconductor memory including a high voltage switching circuitNEC CORP·Filed 1988·Granted May 8, 1990·12 cites·6 claims
- 3148US2016111141A1Semiconductor storage deviceRENESAS ELECTRONICS CORP·Filed 2015·Application pending·0 cites
- 3247US6115288ASemiconductor memory deviceNEC CORP·Filed 1999·Granted Sep 5, 2000·11 cites·10 claims
- 3347US5477186AChopper type differential amplifier using MOS gate capacitorsNEC CORP·Filed 1994·Granted Dec 19, 1995·8 cites·8 claims
- 3445US5736951AHigh speed and high accuracy A/D converterNEC CORP·Filed 1996·Granted Apr 7, 1998·11 cites·2 claims
- 3545US2011122672A1Non-volatile semiconductor memory deviceRENESAS ELECTRONICS CORP·Filed 2011·Application pending·0 cites
- 3644US5942808ASemiconductor device with plural power supply circuits, plural internal circuits, and single external terminalNEC CORP·Filed 1998·Granted Aug 24, 1999·9 cites·12 claims
- 3743US8208313B2Static random access memory (SRAM) and test method of the SRAM having precharge circuit to precharge bit lineKOBATAKE HIROYUKI·Filed 2009·Granted Jun 26, 2012·0 cites·13 claims
- 3843US5773872ASemiconductor device having an integrated differential circuit with an improved common-mode rejection ratio (CMRR)NEC CORP·Filed 1996·Granted Jun 30, 1998·8 cites·8 claims
- 3943US4876462AControl circuit for multipurpose input terminalNEC CORP·Filed 1988·Granted Oct 24, 1989·6 cites·12 claims
- 4042US5198998AErasable programmable read only memoryNEC CORP·Filed 1991·Granted Mar 30, 1993·9 cites·8 claims
- 4142US4910710AInput circuit incorporated in a semiconductor deviceNEC CORP·Filed 1988·Granted Mar 20, 1990·7 cites·15 claims
- 4241US6111792ANon-volatile semiconductor memory device for selective cell flash erasing/programmingNEC CORP·Filed 1999·Granted Aug 29, 2000·8 cites·8 claims
- 4341US5966328ANonvolatile semiconductor memory device having a program areaNEC CORP·Filed 1999·Granted Oct 12, 1999·7 cites·8 claims
- 4441US2016086656A1Semiconductor Device Having Memory Cell With Electrostatic Capacitance CircuitRENESAS ELECTRONICS CORP·Filed 2015·Application pending·0 cites
- 4540US5680132ADigital to analog converter having a string of resistorsNEC CORP·Filed 1995·Granted Oct 21, 1997·9 cites·12 claims
- 4639US6009027ATest method and circuit for semiconductor memoryNEC CORP·Filed 1998·Granted Dec 28, 1999·6 cites·6 claims
- 4739US5812460ANonvolatile semiconductor memory device having test circuit for testing erasing function thereofNEC CORP·Filed 1997·Granted Sep 22, 1998·6 cites·5 claims
- 4837US6097630ANon-volatile semiconductor storage device selecting bit lines on voltage divided from word line selection voltageNEC CORP·Filed 1999·Granted Aug 1, 2000·5 cites·10 claims
- 4937US5059816AHigh speed booster circuitNEC CORP·Filed 1990·Granted Oct 22, 1991·8 cites·5 claims
- 5036US5946229ASemiconductor device having device supplying voltage higher than power supply voltageNEC CORPORATOIN·Filed 1998·Granted Aug 31, 1999·7 cites·8 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →