Inventor · disambiguated record
Hideshi Maeno
Also filed as: MAENO HIDESHI
43 granted patents·3 pending applications·825 citations·filing 1986–2019
98Inventor score
Files withMITSUBISHI ELECTRIC CORP36RENESAS TECH CORP5RENESAS ELECTRONICS CORP4MIUTSUBISHI DENKI KABUSHIKI KA1
Top patents by PatentIndex Score
46 records- 0189US5784384AFlip-flop circuit, scan path and storage circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 21, 1998·79 cites·86 claims
- 0286US5960008ATest circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Sep 28, 1999·62 cites·15 claims
- 0386US5815512ASemiconductor memory testing deviceMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Sep 29, 1998·56 cites·33 claims
- 0482US5946247ASemiconductor memory testing deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Aug 31, 1999·44 cites·8 claims
- 0580US10580513B2Semiconductor device and diagnostic method thereforRENESAS ELECTRONICS CORP·Filed 2018·Granted Mar 3, 2020·5 cites·10 claims
- 0680US7441169B2Semiconductor integrated circuit with test circuitRENESAS TECH CORP·Filed 2006·Granted Oct 21, 2008·8 cites·20 claims
- 0778US4969126ASemiconductor memory device having serial addressing and operating method thereofMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Nov 6, 1990·33 cites·27 claims
- 0877US5771194AMemory circuit, data control circuit of memory circuit and address assigning circuit of memory circuitMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jun 23, 1998·41 cites·27 claims
- 0976US4914379ASemiconductor integrated circuit and method of testing sameMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Apr 3, 1990·32 cites·8 claims
- 1073US6401226B1Electronic system with self-test function and simulation circuit for electronic systemMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jun 4, 2002·34 cites·5 claims
- 1170US5848074AMethod and device for testing content addressable memory circuit and content addressable memory circuit with redundancy functionMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Dec 8, 1998·30 cites·20 claims
- 1268US6504772B2Testing method and test apparatus in semiconductor apparatusMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jan 7, 2003·16 cites·20 claims
- 1367US5841690ASemiconductor memoryMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Nov 24, 1998·28 cites·15 claims
- 1466US6275963B1Test circuit and a redundancy circuit for an internal memory circuitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Aug 14, 2001·25 cites·20 claims
- 1566US5719913APseudo-random number generating circuit and bidirectional shift registerMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 17, 1998·62 cites·14 claims
- 1665US4926424ATest auxiliary circuit for testing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1988·Granted May 15, 1990·20 cites·12 claims
- 1764US6678846B1Semiconductor integrated circuit with a scan path circuitMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jan 13, 2004·11 cites·9 claims
- 1861US6286121B1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Sep 4, 2001·23 cites·10 claims
- 1960US5787033ASemiconductor memory device with reduced probability of power consumptionMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 28, 1998·19 cites·20 claims
- 2059US10777293B2Semiconductor device, memory test method for semiconductor device, and test pattern generation programRENESAS ELECTRONICS CORP·Filed 2019·Granted Sep 15, 2020·1 cites·16 claims
- 2159US6400292B1Semiconductor integrated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jun 4, 2002·10 cites·7 claims
- 2256US5829015ASemiconductor integrated circuit device having multi-port RAM memory with random logic portion which can be tested without additional test circuitryMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Oct 27, 1998·17 cites·5 claims
- 2354US5719819ASemiconductor storage circuit device operating in a plurality of operation modes and corresponding device for designing a semiconductor storage circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 17, 1998·14 cites·22 claims
- 2452US4801871ATesting apparatus for semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Jan 31, 1989·13 cites·10 claims
- 2551US5905737ATest circuitMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 18, 1999·13 cites·11 claims
- 2650US5724367ASemiconductor memory device having scan path for testingMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Mar 3, 1998·13 cites·14 claims
- 2748US6420896B1Semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 16, 2002·5 cites·13 claims
- 2848US5471420AMemory cell array semiconductor integrated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Nov 28, 1995·9 cites·8 claims
- 2948US5197070AScan register and testing circuit using the sameMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Mar 23, 1993·12 cites·22 claims
- 3047US5903579AScan path forming circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted May 11, 1999·12 cites·20 claims
- 3146US5818776ASemiconductor memory device and method of reading data therefromMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Oct 6, 1998·11 cites·13 claims
- 3245US6964000B2Semiconductor integrated circuit device having a test circuit of a random access memoryRENESAS TECH CORP·Filed 2003·Granted Nov 8, 2005·4 cites·17 claims
- 3344US4813043ASemiconductor test deviceMITSUBISHI ELECTRIC CORP·Filed 1987·Granted Mar 14, 1989·12 cites·3 claims
- 3443US6571364B1Semiconductor integrated circuit device with fault analysis functionMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 27, 2003·10 cites·16 claims
- 3542US5654914AMemory cell array semiconductor integrated circuit deviceMIUTSUBISHI DENKI KABUSHIKI KA·Filed 1995·Granted Aug 5, 1997·8 cites·21 claims
- 3640US5742540ASemiconductor memory and layout/circuit information generating apparatusMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Apr 21, 1998·9 cites·9 claims
- 3740US5592424ASemiconductor integrated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jan 7, 1997·7 cites·12 claims
- 3839US7149942B2Semiconductor integrated circuit with test circuitRENESAS TECH CORP·Filed 2003·Granted Dec 12, 2006·0 cites·18 claims
- 3937US6516431B1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Feb 4, 2003·6 cites·10 claims
- 4037US6397363B1Semiconductor integrated circuit device with test circuitMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 28, 2002·5 cites·8 claims
- 4137US2009158087A1Semiconductor integrated circuit with memory repair circuitRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 4236US2011161751A1Semiconductor integrated circuit with memory repair circuitRENESAS ELECTRONICS CORP·Filed 2011·Application pending·0 cites
- 4335US6229741B1Semiconductor integrated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted May 8, 2001·4 cites·7 claims
- 4434US10504609B2Semiconductor device and diagnosis method thereofRENESAS ELECTRONICS CORP·Filed 2017·Granted Dec 10, 2019·0 cites·15 claims
- 4533USRE35591EMemory cell array semiconductor integrated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Aug 19, 1997·2 cites·8 claims
- 4633US2004117704A1Semiconductor integrated circuit device with test circuitRENESAS TECH CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →