Inventor · disambiguated record
Hindrik Willem Mook
Also filed as: MOOK HINDRIK WILLEM
7 granted patents·2 pending applications·47 citations·filing 1998–2025
84Inventor score
Top patents by PatentIndex Score
9 records- 0195US10987705B2Method and system for the removal and/or avoidance of contamination in charged particle beam systemsASML NETHERLANDS BV·Filed 2020·Granted Apr 27, 2021·4 cites·20 claims
- 0294US9981293B2Method and system for the removal and/or avoidance of contamination in charged particle beam systemsMAPPER LITHOGRAPHY IP BV·Filed 2016·Granted May 29, 2018·9 cites·29 claims
- 0392US11738376B2Method and system for the removal and/or avoidance of contamination in charged particle beam systemsASML NETHERLANDS BV·Filed 2021·Granted Aug 29, 2023·2 cites·20 claims
- 0488US10632509B2Method and system for the removal and/or avoidance of contamination in charged particle beam systemsASML NETHERLANDS BV·Filed 2018·Granted Apr 28, 2020·4 cites·31 claims
- 0583US12202019B2Method and system for the removal and/or avoidance of contamination in charged particle beam systemsASML NETHERLANDS BV·Filed 2023·Granted Jan 21, 2025·0 cites·20 claims
- 0657US6452169B1Wien filterUNIV DELFT TECH·Filed 1998·Granted Sep 17, 2002·15 cites·4 claims
- 0756US6670611B1Electron microscopeUNIV DELFT TECH·Filed 1999·Granted Dec 30, 2003·13 cites·16 claims
- 0852US2025233597A1Adc calibration for microscopyASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0950US2025316444A1Radiation tolerant detector architecture for charged particle detectionASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →