Inventor · disambiguated record
Hirotaka Nakajima
Also filed as: NAKAJIMA HIROTAKA
9 granted patents·2 pending applications·156 citations·filing 1987–2025
89Inventor score
Files withKOMATSU DENSHI KINZOKU KK4TOSHIBA KK4ANRITSU CORP1SUMITOMO SEIKA CHEMICALS1TORAY INDUSTRIES1
Top patents by PatentIndex Score
11 records- 0189US6858076B1Method and apparatus for manufacturing single-crystal ingotKOMATSU DENSHI KINZOKU KK·Filed 2000·Granted Feb 22, 2005·33 cites·6 claims
- 0273US4873985AUltrasonic imaging apparatus utilizing doppler flow meteringTOSHIBA KK·Filed 1988·Granted Oct 17, 1989·36 cites·9 claims
- 0368US7141113B1Production method for silicon single crystal and production device for single crystal ingot, and heat treating method for silicon crystal waferKOMATSU DENSHI KINZOKU KK·Filed 1999·Granted Nov 28, 2006·22 cites·5 claims
- 0460US2024294386A1Method and device for manufacturing carbon monoxideSUMITOMO SEIKA CHEMICALS·Filed 2022·Application pending·0 cites
- 0558US5072735AUltrasonic imaging apparatusTOSHIBA KK·Filed 1989·Granted Dec 17, 1991·23 cites·14 claims
- 0657US2025238728A1Article inspection apparatus and learning model update systemANRITSU CORP·Filed 2025·Application pending·0 cites
- 0750US5447158AUltrasonic imaging method and system capable of displaying B-mode image and color flow mapping image over wide fieldTOSHIBA KK·Filed 1993·Granted Sep 5, 1995·22 cites·13 claims
- 0841US5925185AMagnetic field-applied fabrication method for a semiconductor single crystal and an apparatus thereforKOMATSU DENSHI KINZOKU KK·Filed 1997·Granted Jul 20, 1999·8 cites·8 claims
- 0934US6030450AMethod of fabricating a silicon single crystalKOMATSU DENSHI KINZOKU KK·Filed 1997·Granted Feb 29, 2000·3 cites·12 claims
- 1032US4837749AUltrasonic imaging system for obtaining zoom video images of an objectTOSHIBA KK·Filed 1987·Granted Jun 6, 1989·5 cites·19 claims
- 1131US6629660B1Take-up method and device for synthetic fiber and method of using thread packageTORAY INDUSTRIES·Filed 1999·Granted Oct 7, 2003·4 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →