Inventor · disambiguated record
Hiroto Nakamura
Also filed as: NAKAMURA HIROTO
52 granted patents·17 pending applications·1,655 citations·filing 1975–2025
99Inventor score
Files withADVANTEST CORP24SEIKO EPSON CORP22TOSHIBA LIGHTING & TECHNOLOGY8OLYMPUS CORP5MATSUSHITA ELECTRONICS CORP3
Top patents by PatentIndex Score
69 records- 0196US4204890AMethod of producing non-oriented silicon steel sheets having an excellent electromagnetic propertyKAWASAKI STEEL CO·Filed 1978·Granted May 27, 1980·51 cites·7 claims
- 0295US6524383B2Method for manufacturing pigment dispersion, pigment dispersion obtained by this method, and ink jet recording ink using sameSEIKO EPSON CORP·Filed 2001·Granted Feb 25, 2003·57 cites·20 claims
- 0395US6379443B1Ink jet recording method and ink composition for use in said methodSEIKO EPSON CORP·Filed 2000·Granted Apr 30, 2002·57 cites·30 claims
- 0495US5623296AIntermediate transfer ink jet recording methodSEIKO EPSON CORP·Filed 1993·Granted Apr 22, 1997·123 cites·20 claims
- 0594US6802893B1Ink for ink-jet recording and process for producing the same, ink set for ink-jet recording, and ink cartridgeSEIKO EPSON CORP·Filed 2000·Granted Oct 12, 2004·53 cites·47 claims
- 0694US5190582AInk for ink-jet printingSEIKO EPSON CORP·Filed 1990·Granted Mar 2, 1993·137 cites·13 claims
- 0792US7362117B2Cooling fin connected to a cooling unit and a pusher of the testing apparatusADVANTEST CORP·Filed 2006·Granted Apr 22, 2008·16 cites·6 claims
- 0892US7074843B2Microencapsulated pigment, production process therefor, aqueous dispersion and ink jet recording inkSEIKO EPSON CORP·Filed 2002·Granted Jul 11, 2006·43 cites·14 claims
- 0990US6445203B1Electric device testing apparatusADVANTEST CORP·Filed 1999·Granted Sep 3, 2002·103 cites·22 claims
- 1090US6384593B1Semiconductor device testing apparatusADVANTEST CORP·Filed 2000·Granted May 7, 2002·40 cites·10 claims
- 1189US6354792B1IC receiving tray storage device and mounting apparatus for the sameADVANTEST CORP·Filed 1999·Granted Mar 12, 2002·102 cites·16 claims
- 1289US6114411AInk composition for ink jet recording and ink jet recording processSEIKO EPSON CORP·Filed 1996·Granted Sep 5, 2000·59 cites·2 claims
- 1388US6919734B2Cooling fin connected to a cooling unit and a pusher of the testing apparatusADVANTEST CORP·Filed 2003·Granted Jul 19, 2005·31 cites·7 claims
- 1488US6648953B2Ink composition for ink jet recording, process for the preparation thereof, and ink jet recording process using said ink compositionSEIKO EPSON CORP·Filed 2001·Granted Nov 18, 2003·28 cites·18 claims
- 1587US6104183ASemiconductor device testing apparatusADVANTEST CORP·Filed 1996·Granted Aug 15, 2000·62 cites·21 claims
- 1686US6830612B1Ink for ink jet recordingSEIKO EPSON CORP·Filed 2000·Granted Dec 14, 2004·26 cites·19 claims
- 1786US6339321B1Electronic device tray electronic device tray, transporting apparatus, and electronic device testing apparatusADVANTEST CORP·Filed 1999·Granted Jan 15, 2002·85 cites·28 claims
- 1884US7048194B2Printing paper with memory element mounted thereon and printing technique using such printing paperSEIKO EPSON CORP·Filed 2003·Granted May 23, 2006·60 cites·34 claims
- 1983US8941729B2Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing methodKIKUCHI ARITOMO·Filed 2011·Granted Jan 27, 2015·7 cites·3 claims
- 2083US5997136AInk jet recording method and apparatus thereforSEIKO EPSON CORP·Filed 1995·Granted Dec 7, 1999·51 cites·21 claims
- 2181US6075216ADevice transfer and reinspection method for IC handlerADVANTEST CORP·Filed 1997·Granted Jun 13, 2000·64 cites·6 claims
- 2280US5120383AThermal transfer ink sheet and method of printingSEIKO EPSON CORP·Filed 1989·Granted Jun 9, 1992·30 cites·37 claims
- 2379US4143293AIn line electron guns for color tubes, each having a control grid with vertically elliptical apertureMATSUSHITA ELECTRONICS CORP·Filed 1977·Granted Mar 6, 1979·19 cites·1 claims
- 2476US7726773B2Waste liquid recovery apparatus, relay and liquid jetting apparatusSEIKO EPSON CORP·Filed 2005·Granted Jun 1, 2010·4 cites·37 claims
- 2576US6932635B2Electronic component testing socket and electronic component testing apparatus using the sameADVANTEST CORP·Filed 2003·Granted Aug 23, 2005·20 cites·15 claims
- 2674US7408630B2Recorded article with anti-counterfeit measuresSEIKO EPSON CORP·Filed 2005·Granted Aug 5, 2008·2 cites·1 claims
- 2773US6409330B1Sublimation transfer ink jet recording method and ink composition for use thereinSEIKO EPSON CORP·Filed 1999·Granted Jun 25, 2002·22 cites·10 claims
- 2873US5625287ATest tray positioning stopper mechanism for automatic handlerADVANTEST CORP·Filed 1995·Granted Apr 29, 1997·23 cites·4 claims
- 2973US4914079AThermal transfer ink medium and method of printingSEIKO EPSON CORP·Filed 1987·Granted Apr 3, 1990·18 cites·35 claims
- 3072US5772387ADevice transfer apparatus and device reinspection method for IC handlerADVANTEST CORP·Filed 1995·Granted Jun 30, 1998·43 cites·8 claims
- 3171USD569718SClip attachmentSHACHIHATA INC·Filed 2006·Granted May 27, 2008·18 cites·1 claims
- 3271US2025241700A1Drive deviceOLYMPUS CORP·Filed 2025·Application pending·0 cites
- 3369US5010352AThermal transfer ink printing apparatusSEIKO EPSON CORP·Filed 1990·Granted Apr 23, 1991·16 cites·6 claims
- 3468US6248967B1IC testing apparatusADVANTEST CORP·Filed 1999·Granted Jun 19, 2001·31 cites·16 claims
- 3567US6083315AAgglomerated pigment, process for producing the same, aqueous pigment dispersion, and water-based ink compositionSEIKO EPSON CORP·Filed 1997·Granted Jul 4, 2000·26 cites·14 claims
- 3667US4293336ACold rolled non-oriented electrical steel sheetKAWASAKI STEEL CO·Filed 1980·Granted Oct 6, 1981·14 cites·1 claims
- 3766US12295638B2Drive deviceOLYMPUS CORP·Filed 2021·Granted May 13, 2025·0 cites·14 claims
- 3866US8294759B2Calibration method of electronic device test apparatusKIKUCHI ARITOMO·Filed 2006·Granted Oct 23, 2012·4 cites·18 claims
- 3965US8816575B2Socket and lamp engagement configurations for a luminaireTOSHIBA LIGHTING & TECHNOLOGY·Filed 2012·Granted Aug 26, 2014·2 cites·9 claims
- 4064US5177434AIC test equipment having a horizontally movable chuck carrierADVANTEST CORP·Filed 1991·Granted Jan 5, 1993·27 cites·7 claims
- 4162US7371078B2Insert attachable to an insert magazine of a tray for holding an area array type electronic component to be testedADVANTEST CORP·Filed 2004·Granted May 13, 2008·9 cites·14 claims
- 4261US12458390B2Drive deviceOLYMPUS CORP·Filed 2022·Granted Nov 4, 2025·0 cites·18 claims
- 4361US7601417B2Recorded matter having countermeasure against forgingSEIKO EPSON CORP·Filed 2002·Granted Oct 13, 2009·4 cites·4 claims
- 4458US7683108B2Microencapsulated pigment, production process therefor, aqueous dispersion, and ink jet recording inkSEIKO EPSON CORP·Filed 2006·Granted Mar 23, 2010·1 cites·26 claims
- 4557US5906472AApparatus for removing and storing semiconductor device traysADVANTEST CORP·Filed 1998·Granted May 25, 1999·23 cites·7 claims
- 4653US2003110105A1Expendable supplies, package for packaging expendable supplies, collective package, system for managing expendable supplies, and method for managing expendable suppliesSEIKO EPSON CORP·Filed 2002·Application pending·0 cites
- 4752US6111246ASemiconductor device testing apparatus having presence or absence detectors issuing an alarm when an error occursADVANTEST CORP·Filed 1997·Granted Aug 29, 2000·21 cites·31 claims
- 4851US2005225346A1Cooling fin connected to a cooling unit and a pusher of the testing apparatusADVANTEST CORP·Filed 2005·Application pending·0 cites
- 4951US2006053030A1Method of recycling a liquid cartridgeNAKAMURA HIROTO·Filed 2005·Application pending·0 cites
- 5048US2015084529A1Power Supply Device, Luminaire, and Lighting SystemTOSHIBA LIGHTING & TECHNOLOGY·Filed 2014·Application pending·0 cites
Showing the top 50 of 69 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →