Inventor · disambiguated record
Hideki Nei
Also filed as: NEI HIDEKI
2 granted patents·6 citations·filing 2012–2012
49Inventor score
Files withNIHON MICRONICS KK2
Top patents by PatentIndex Score
2 records- 0175US9069008B2Inspection apparatus for semiconductor devices and chuck stage for the inspection apparatus that is movable with respect to the front and back side electrodesNIHON MICRONICS KK·Filed 2012·Granted Jun 30, 2015·5 cites·9 claims
- 0253US9146256B2Probe assembly for inspecting power semiconductor devices and inspection apparatus using the same, the probe assembly having a probe block, a probe, and a cooling deviceNIHON MICRONICS KK·Filed 2012·Granted Sep 29, 2015·1 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →